IR / Near Infrared

NIR-optimized objectives for semiconductor inspection, failure analysis & multiphoton imaging — ships from the US.

IR and Near-Infrared Corrected Objectives

Near-infrared objectives are optimized for transmission and chromatic correction beyond the visible spectrum, typically 700–1300nm and above. They're the standard choice for semiconductor inspection and failure analysis (imaging through silicon), as well as deep-tissue multiphoton and IR-DIC imaging in life science. This collection includes Olympus LCPLN IR and Nikon CFI Apo NIR series objectives, along with long working distance options for wafer and package-level inspection. Standard visible-light objectives lose significant transmission in the NIR — if your application involves silicon backside imaging or two-photon excitation, an IR-corrected objective is worth the difference. Contact us for transmission specs at your working wavelength before you order.

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IR & Near-Infrared Objectives | Semiconductor & Deep Imaging

Near-infrared objectives are optimized for transmission and chromatic correction beyond the visible spectrum, typically 700–1300nm and above. They're the standard choice for semiconductor inspection and failure analysis (imaging through silicon), as well as deep-tissue multiphoton and IR-DIC imaging in life science. This collection includes Olympus LCPLN IR and Nikon CFI Apo NIR series objectives, along with long working distance options for wafer and package-level inspection. Standard visible-light objectives lose significant transmission in the NIR — if your application involves silicon backside imaging or two-photon excitation, an IR-corrected objective is worth the difference. Contact us for transmission specs at your working wavelength before you order.