Olympus LMPlan N 5X IR Objective | 0.10 NA Long Working Distance, Infinity Corrected

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SKU: N2738700

Regular price $3,500.00
Sale price $3,500.00 Regular price $3,900.00 save $400.00
Premium 5× near-infrared objective with extra-long working distance — ideal for IR imaging and silicon wafer inspection.

KEY FEATURES

  • 5× Magnification, NA 0.13 — Wide field of view with excellent depth of field for overview imaging.
  • Near-Infrared (IR) Optimized — Corrected for 700-1600 nm wavelengths, ideal for silicon wafer inspection and IR imaging applications.
  • Extra-Long Working Distance (~23 mm) — Exceptional clearance for thick specimens and probe-based measurements.
  • LMPLAN Optical Design — Delivers flat-field imaging optimized for infrared wavelengths.
  • RMS Thread Mount (20.32 x 36 TPI) — Standard threaded mount compatible with upright research microscopes.
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Product Overview

The Olympus LMPLAN N 5× IR Objective is a specialized, extra-long working distance objective engineered for near-infrared imaging applications. Optimized for wavelengths from 700 to 1600 nm, this objective is an essential tool for semiconductor inspection, silicon wafer analysis, and any application requiring imaging through materials that are opaque in visible light but transparent in the infrared spectrum.

Near-infrared microscopy enables unique capabilities that are impossible with conventional visible-light objectives. Silicon, which is opaque to visible light, becomes transparent in the near-IR, allowing you to inspect internal structures, defects, and features within silicon wafers and integrated circuits without destructive sectioning. This makes IR objectives indispensable for semiconductor failure analysis, quality control, and research applications.

The exceptional 23 mm working distance is one of the longest available for a 5× objective, providing generous clearance that is critical when working with thick specimens, probe stations, or samples requiring manipulation during observation. This extended working distance also dramatically reduces the risk of objective damage from contact with the specimen, protecting your investment in precision optics.

At 5× magnification with a numerical aperture of 0.13, this objective delivers a wide field of view with excellent depth of field, making it ideal for initial specimen survey, large-area inspection, and locating regions of interest before switching to higher magnifications. The LMPLAN optical design ensures flat-field imaging with minimal distortion, optimized specifically for infrared wavelengths.

Compatible with upright research microscopes via standard RMS thread mount, this objective integrates seamlessly into semiconductor, materials science, and photonics research workflows. Requires an IR-sensitive camera and appropriate illumination for infrared imaging.

Technical Specifications

Magnification
Numerical Aperture (NA) 0.13
Wavelength Range 700-1600 nm (Near-Infrared) + Visible
Optical Design LMPLAN (IR-Optimized)
Working Distance ~23 mm (Extra-Long)
Mount RMS Thread (20.32 x 36 TPI)
Application Near-Infrared Microscopy
Compatibility Upright research microscopes
SKU N2738700
Condition New

Microscope Compatibility

Typical Applications

Silicon wafer and IC inspection through silicon
Semiconductor failure analysis and defect detection
Photonics and optoelectronics research
Near-infrared spectroscopy and imaging
Materials characterization in the IR spectrum
Probe station and in-situ testing applications
  • Designed for Mixed-Brand Lab Environments

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    Ideal for labs using multiple microscope platforms

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