Olympus LCPLN50XIR 50X Objective – Near-IR (700-1600 nm)

Advanced 50× NIR objective with long working distance and broad spectral transmission.

• 🔬 50× Magnification, NA 0.65 — Strong resolution and light collection for detailed imaging.
• 🌈 Near-Infrared Optimized (700–1600 nm) — Excellent transmission for IR microscopy and inspection.
• 🧠 Plan Achromat Optical Design — Flat field and reduced aberrations across wavebands.
• 📏 Long Working Distance (~4.5 mm) — Space for thicker samples and tools during inspection.
• ⚙️ Standard RMS Thread Mount — Compatible with typical research microscopes.

🧪 Product Description

The Olympus LCPLN50XIR 50× NIR Objective is a specialized microscope objective designed for advanced imaging that spans both the visible and near-infrared (NIR) spectral range (700–1600 nm). This makes it an excellent choice for applications that require high transmission and detailed contrast beyond the visible spectrum, such as near-IR microscopy and industrial inspection workflows where subsurface features must be observed.

With 50× magnification and a numerical aperture (NA) of 0.65, this objective strikes an effective balance between resolution and light gathering capability. The Plan Achromat optical design minimizes chromatic and spherical aberrations, delivering consistently clear images with high contrast from center to edge — whether imaging brightfield, IR, or multi-modal techniques.

A key feature of this objective is its long working distance (approximately 4.5 mm), which reduces the risk of specimen or substrate damage and provides extra space for thicker samples, sample holders, or inspection tools. This is particularly important in industrial microscopy, materials science, and semiconductor inspection applications.

The standard RMS threaded mount ensures compatibility with a wide range of upright research microscope systems used in laboratories and inspection suites around the world.

🔎 Typical Applications

• Near-infrared (700–1600 nm) microscopy
• Silicon wafer and semiconductor inspection
• Visible + IR imaging workflows
• Materials science and inspection labs
• Flat-field measurement and documentation

📊 Key Specifications