Olympus LCPlan N 20X IR Objective | 0.45 NA Near-Infrared, Infinity Corrected

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SKU: N2738900

Regular price $6,200.00
Sale price $6,200.00 Regular price $6,800.00 save $600.00
20ร— near-infrared objective with long working distance and high transmission.

KEY FEATURES

  • Optimized for Near-IR (700โ€“1600 nm) โ€” Excellent transmission for IR microscopy and inspection.
  • 20ร— Magnification, NA 0.45 โ€” Balanced resolution and light gathering for high-contrast imaging.
  • Plan Achromat Optical Design โ€” Flat field and reduced aberrations for accurate imaging.
  • Long Working Distance (~8.2โ€“8.9 mm) โ€” Accommodates thicker samples and inspection setups.
  • Standard RMS Threaded Mount โ€” Compatible with common upright microscope systems.
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Product Overview

The Olympus LCPLN20XIR 20ร— NIR Objective is a specialized microscope objective designed for advanced imaging that extends from the visible into the near-infrared (NIR) spectrum. Optimized for high transmission between 700 nm and 1600 nm, this objective excels in IR microscopy, silicon wafer inspection, and applications requiring reliable performance beyond the visible range.

With 20ร— magnification and a numerical aperture (NA) of 0.45, this objective provides a balanced combination of resolution and light collection suitable for general microscopy as well as IR imaging. Its Plan Achromat optical design minimizes chromatic and spherical aberrations, helping deliver consistently sharp images with high contrast across the field.

A long working distance of approximately 8.2โ€“8.9 mm reduces the risk of specimen damage and offers additional space for thicker substrates, sample holders, or inspection tools โ€” an important benefit in industrial and materials science workflows.

This objective features a standard RMS threaded mount for seamless integration with upright research microscopes used in laboratories and inspection suites.

Why Use IR Objectives Instead of Standard Objectives?

Standard microscope objectives are optimized for visible light and perform poorly in near-infrared applications.

Olympus IR objectives:

Deliver higher transmission in NIR wavelengths
Improve contrast in silicon and semiconductor materials
Enable imaging beneath surfaces not visible with standard optics

This makes them essential for inspection, electronics, and advanced materials analysis

Technical Specifications

Magnification 20ร—
Numerical Aperture (NA) 0.45
Optical Design Plan Achromat
Wavelength Range Visible to Near-IR (700โ€“1600 nm)
Working Distance ~8.18โ€“8.93 mm
Mount RMS (20.32 ร— 36 TPI)
Field Number ~22 mm
Cover Glass 0โ€“1.2 mm correction (collar)
Condition New

Microscope Compatibility

Typical Applications

Near-infrared (700โ€“1600 nm) microscopy
Silicon wafer and semiconductor inspection
Visible and IR imaging workflows
Materials science and research applications
Flat-field documentation and measurement
  • Designed for Mixed-Brand Lab Environments

    Olympus, Nikon, Zeiss, Leica components in one place

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    Professionally sourced and verified for performance

  • Backed by Spach Optics Warranty & Support

    Ideal for labs using multiple microscope platforms

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