Zeiss Plan Neofluar 2.5x Objective

ZEISS PLAN NEOFLUAR 2.5X OBJECTIVE

Achieve versatile low-magnification imaging with flat-field correction and fluorescence capability, featuring:

• 🔬 2.5x magnification with 0.075 numerical aperture for ultra-wide-field observation
• 📏 9.5mm working distance for thick specimens and manipulation
• 🌈 Plan Neofluar design combining flat-field correction with fluorescence optimization
• 🔧 RMS thread mount for universal microscope compatibility
• ⭐ Excellent pre-owned condition with flawless optical performance

🔧 Product Description

The Zeiss Plan Neofluar 2.5x objective provides the lowest magnification in the Plan Neofluar series, delivering an exceptionally wide field of view ideal for initial specimen screening, large-area tissue section imaging, and whole-slide overview applications. At 2.5x magnification, this objective captures extensive specimen regions in a single field, enabling rapid survey of samples before transitioning to higher magnifications for detailed examination. The Plan Neofluar optical design combines improved chromatic correction with low autofluorescence characteristics, making this objective suitable for both brightfield and fluorescence imaging workflows. The 0.075 numerical aperture provides adequate light-gathering capability for moderate-intensity fluorescence signals while delivering exceptional depth of field for three-dimensional specimens and thick tissue sections. The 9.5mm working distance accommodates standard slides with coverslips and allows room for environmental chambers during live-cell imaging. The RMS thread mount ensures compatibility with a wide range of microscope platforms from multiple manufacturers. This ultra-low magnification objective is particularly valuable in pathology laboratories for whole-slide screening, materials science for large-area component inspection, and biological research requiring comprehensive specimen overview before detailed analysis.

🔎 Typical Applications

• Whole-slide tissue section screening and pathology overview
• Large-area fluorescence imaging and specimen survey
• Initial specimen orientation before higher-magnification examination
• Materials characterization requiring wide-field inspection
• Thick specimen imaging with extended depth of field
• Multi-well plate imaging and high-throughput screening

📊 Key Specifications

University purchase orders are welcomed and accepted. Contact us for institutional pricing and procurement assistance.