Schott A08927 Fiber Optic Backlight 8.0" x 8.0"
Regular price
$1,551.00
The Schott A08927 Fiber Optic Backlight (8.0" × 8.0") is the largest-format precision fiber optic transmitted light illuminator in the Schott backlight range — delivering uniform, diffuse backlighting over an 8.0" × 8.0" (203mm × 203mm) active area for machine vision, industrial inspection, and scientific imaging applications requiring shadow-free transmitted illumination over large assemblies, panels, documents, or specimens.
KEY FEATURES
- 8.0" × 8.0" (203mm × 203mm) active area — the largest Schott fiber optic backlight, providing maximum coverage for wide-field transmitted light inspection
- Uniform diffuse transmitted illumination — shadow-free backlighting for crisp silhouette imaging, edge detection, and transmitted light inspection across the full 64 square inch active area
- Compatible with Schott KL series and ColdVision cold light sources via standard fiber optic light guide connection
- Robust, low-profile housing — designed for integration into automated machine vision systems, inspection fixtures, and production line setups
- 🇩🇪 Schott quality, made in Germany — precision fiber optic construction for consistent, uniform light output and long service life
- New — part number A08927
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Technical Specifications
| Part Number | A08927 |
| Type | Fiber optic backlight (transmitted light illuminator) |
| Active Area | 8.0" × 8.0" (203mm × 203mm) |
| Total Active Coverage | 64 sq in (41,209 mm²) |
| Illumination Type | Uniform diffuse transmitted light (cold, IR-free) |
| Compatible Light Sources | Schott KL series, ColdVision cold light sources |
| Country of Origin | Germany |
| Condition | New |
| SKU | A08927 |
| Weight | 1 lb |
Microscope Compatibility
Typical Applications
Large PCB, panel, and flat panel display inspection requiring wide-area backlighting
Wide-format document, film, and transparency illumination
Silhouette and edge detection imaging of large assemblies and components
Production line inspection of oversized components requiring maximum backlight coverage
Dimensional measurement and gauging of large parts
Glass substrate, solar panel, and semiconductor wafer inspection
