Schott A08910 Lightline Fiber Optic Line Light 10.0" x 0.020"
Regular price
$1,190.00
The Schott A08910 Lightline is a large-format precision fiber optic line light delivering a narrow, uniform 10.0" × 0.020" illuminated line — the longest configuration in the Schott Lightline range, designed for Schott KL series and ColdVision cold light sources and engineered for wide-field line-scan imaging, web inspection, and large-format surface inspection applications requiring maximum line length with an exceptionally narrow line width.
KEY FEATURES
- 10.0" × 0.020" (254mm × 0.51mm) illuminated line — the longest Schott Lightline configuration, with the narrowest line width in the range for maximum spatial resolution
- High-intensity fiber optic construction for consistent, bright, uniform line illumination across the full 10-inch length without hot spots or intensity falloff
- Ideal for wide-field line-scan cameras and machine vision systems requiring maximum line length and high spatial resolution across large inspection fields
- Cold light (IR-free) illumination — protects heat-sensitive specimens, films, and materials during extended high-speed inspection runs
- 🇩🇪 Schott quality, made in Germany — precision fiber optic construction for consistent line uniformity and long service life
- New — part number A08910
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Technical Specifications
| Part Number | A08910 |
| Type | Fiber optic line light (Lightline) |
| Illuminated Line Dimensions | 10.0" × 0.020" (254mm × 0.51mm) |
| Line Length | 10.0" (254mm) — longest in Schott Lightline range |
| Line Width | 0.020" (0.51mm) — narrowest in Schott Lightline range |
| Compatible Light Sources | Schott KL series, ColdVision cold light sources |
| Illumination Type | Cold light (IR-free), uniform line |
| Country of Origin | Germany |
| Condition | New |
| SKU | A08910 |
Microscope Compatibility
Typical Applications
Wide-field line-scan camera illumination for machine vision and high-speed automated inspection
Web, film, paper, and sheet inspection in high-speed production environments
Large-format surface defect detection requiring maximum line length coverage
High-resolution dimensional measurement and gauging with structured line light
3D profilometry and structured light scanning of large surfaces
Flat panel display and glass substrate inspection
