Olympus U-TP137 Quarter Wave Plate
Olympus U-TP137 Quarter Wave Plate

Olympus U-TP137 Quarter Wave Plate

In stock

SKU: U-TP137

$550.00
Quarter-wave retardation plate for polarized light microscopy — ideal for converting linearly polarized light to circular polarization, interference figure analysis, and advanced birefringence characterization.

KEY FEATURES

  • Quarter-Wave (137 nm) Retardation — converts linear to circular polarization for advanced POL techniques
  • Interference Figure Analysis — used for conoscopic observation and optical axis determination
  • Used with U-TAD adapter in the U-ANT analyzer system
  • New condition
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Product Overview

The Olympus U-TP137 is a quarter-wave (137 nm) retardation plate used in polarized light microscopy for advanced optical analysis. Inserted into the optical path via the U-TAD adapter, it introduces a 137 nm (quarter-wave) retardation that converts linearly polarized light to circularly polarized light. This is used in conoscopic observation for interference figure analysis, optical axis determination, and sign of birefringence measurement. The quarter-wave plate is an essential accessory for advanced mineralogical and crystallographic analysis, complementing the first-order red plate (U-TP530) in a complete polarization microscopy accessory set.

Technical Specifications

Type Quarter-Wave Retardation Plate
Retardation 137 nm (quarter-wave)
Adapter Required U-TAD (used with U-ANT analyzer)
SKU OLYMPUS-U-TP137
Condition New
Country of Origin Japan

Microscope Compatibility

Typical Applications

Conoscopic interference figure analysis
Optical axis and optic sign determination
Advanced mineral identification and crystallography
Circular polarization microscopy
Research-grade polarized light microscopy

  • Designed for Mixed-Brand Lab Environments

    Olympus, Nikon, Zeiss, Leica components in one place

  • Quality-Verified New & Pre-Owned Equipment

    Professionally sourced and verified for performance

  • Backed by Spach Optics Warranty & Support

    Ideal for labs using multiple microscope platforms

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