Olympus U-RLA Reflected Light Illuminator

🔬 Olympus U-RLA reflected light vertical illuminator — brightfield and darkfield reflected light for Olympus BX series upright microscopes
⚡ Brightfield and darkfield modes — switchable between direct reflected light (BF) and oblique scattered light (DF) for versatile opaque specimen inspection
🎯 Vertical illuminator design — tungsten-halogen lamp positioned at the principal focal point of the collector lens for uniform, Köhler-quality reflected illumination
🏭 Olympus OEM — guaranteed fit and optical performance on compatible BX series platforms
✅ SKU U-RLA / Cat. 5-UR300 — excellent condition, significant savings vs. list price of $2,500

🔧 Product Description

The Olympus U-RLA is a reflected light vertical illuminator providing brightfield and darkfield epi-illumination for Olympus BX series upright microscopes. In a reflected light vertical illuminator, the tungsten-halogen lamp filament is positioned near the principal focal point of the collector lens, enabling Köhler-quality illumination of the specimen surface through the objective. Light travels down through the objective, strikes the specimen surface, and reflects back up through the same objective to the observer — producing even, high-quality reflected light images of opaque specimens. In brightfield mode, the directly reflected beam is collected for standard surface observation. In darkfield mode, the direct beam is blocked and only obliquely scattered light is collected, revealing surface defects, grain boundaries, scratches, and fine topographic features with high contrast against a dark background. The U-RLA is the brightfield/darkfield reflected light illuminator in the Olympus BX accessory range — distinct from the U-URA universal illuminator, which additionally supports fluorescence epi-illumination via a filter cube turret. Built to Olympus factory specifications (catalog number 5-UR300), the U-RLA delivers consistent reflected light performance for materials and industrial microscopy applications. This unit is in excellent condition at a significant discount from the list price.

🔎 Typical Applications

• Metallography — brightfield and darkfield reflected light inspection of polished metal sections, grain structure, and phase identification
• Electronics and PCB inspection — surface defect detection on solder joints, traces, and components under reflected light
• Semiconductor and wafer inspection — brightfield and darkfield surface analysis on polished silicon and compound semiconductor wafers
• Mineralogy and geology — reflected light ore mineral identification and opaque mineral analysis
• Industrial quality control — surface inspection of precision machined parts, coatings, and materials under BF and DF reflected illumination

📊 Key Specifications

Universities and research institutions are welcome to purchase using an official purchase order. Please contact us to arrange PO-based ordering.