Olympus U-ETR-4 Erect Image Trinocular Head

In stock

SKU: N2167200

Regular price $2,600.00
Sale price $2,600.00 Regular price $5,152.00 save $2,552.00

KEY FEATURES

  • Olympus U-ETR-4 erect image trinocular observation head for BX and MX series upright microscopes
  • Erect (non-inverted) image orientation — essential for reflected light industrial and materials inspection where specimen orientation must match the real-world view
  • Trinocular port — simultaneous eyepiece observation and camera/imaging output without splitting the optical path
  • Made in Japan by Olympus — guaranteed OEM fit and optical quality
  • SKU N2167200 / Cat. 3-U157EC — demonstration unit, excellent condition
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Product Overview

The Olympus U-ETR-4 is an erect image trinocular observation head designed for Olympus BX and MX series upright microscopes. Standard microscope heads produce an inverted image — the specimen appears flipped relative to its real-world orientation. The U-ETR-4 corrects this by delivering an erect (upright, non-inverted) image to both the eyepieces and the trinocular camera port, which is critical for reflected light industrial and materials science applications where the operator must navigate the specimen stage intuitively and correlate the microscope image directly with the physical specimen orientation. This makes the U-ETR-4 the preferred head for semiconductor wafer inspection, PCB analysis, metallographic examination, and other industrial quality control workflows on BX and MX series platforms. The trinocular port allows simultaneous live observation through the eyepieces and camera capture without requiring a beam-splitting compromise. This unit is in excellent demonstration condition at a significant discount from the list price of $5,152.

Technical Specifications

Olympus Part Number N2167200
Catalog Number 3-U157EC
Model U-ETR-4
Type Erect Image Trinocular Observation Head
Image Orientation Erect (non-inverted)
Ports 2 × eyepiece + 1 × trinocular camera port
Compatible Microscopes Olympus BX and MX series
Country of Origin Japan
HS Code 901190
Condition Demonstration Unit — Excellent

Microscope Compatibility

Typical Applications

Semiconductor and wafer inspection — erect image orientation for intuitive stage navigation and defect mapping
PCB and electronics quality control — reflected light inspection with correct left-right and top-bottom orientation
Metallography and materials science — polished section examination on BX or MX series systems
Industrial microscopy on Olympus MX series platforms requiring erect image observation
Simultaneous eyepiece observation and camera documentation via the trinocular port
  • Designed for Mixed-Brand Lab Environments

    Olympus, Nikon, Zeiss, Leica components in one place

  • Quality-Verified New & Pre-Owned Equipment

    Professionally sourced and verified for performance

  • Backed by Spach Optics Warranty & Support

    Ideal for labs using multiple microscope platforms

  • Fast, Reliable U.S. Shipping

    Most orders ship quickly from within the United States

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