Olympus SZX7 Stereo Microscope with Coaxial Illumination
SKU: OLYMPUS-SZX7-COAXIAL
Regular price
$7,500.00
Sale price
$7,500.00
Regular price
$15,500.00
save $8,000.00
Olympus SZX7 Stereo Microscope with Coaxial Illumination — Quarter-Wave Lambda Plate | 12X–84X | Trinocular | Excellent
KEY FEATURES
- Dual fiber optic coaxial illumination delivers even, shadow-free incident light perpendicular to the specimen — ideal for reflective and opaque surfaces
- Quarter-wave lambda plate reduces specular reflections and enhances surface topography on metallic and semiconductor specimens
- SZX7 zoom body with 7:1 zoom ratio — 12X to 84X magnification range with DFPL 1.5X objective and 10X widefield eyepieces
- Trinocular head with dedicated camera port for digital imaging, documentation, and measurement
- Widefield adjustable 10X eyepieces with diopter correction for comfortable extended viewing
- Excellent condition — fully inspected and verified
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Technical Specifications
| Model | Olympus SZX7 |
| Zoom Body | SZX7 — 7:1 zoom ratio |
| Magnification Range | 12X – 84X |
| Objective | DFPL 1.5X |
| Eyepieces | Widefield Adjustable 10X |
| Head Type | Trinocular with camera port |
| Illumination | Dual fiber optic coaxial illuminator |
| Quarter-Wave Lambda Plate | Yes — included |
| SKU | OLYMPUS-SZX7-COAXIAL |
| Condition | Excellent |
| Country of Origin | Japan |
Microscope Compatibility
| Olympus SZX series objectives (DFPL, SDFPL, DFPLAPO) | |
| Olympus SZX series trinocular heads and binocular heads | |
| Standard C-mount cameras via trinocular port (with appropriate adapter) | |
| Olympus DP and UC series digital cameras | |
| Olympus fiber optic light sources (KL series and compatible) | |
| Any standard fiber optic light source with Olympus SZX coaxial illuminator connector |
Typical Applications
Semiconductor and electronics inspection (wafers, PCBs, solder joints)
Metallographic surface inspection and failure analysis
Gemology and jewelry inspection
Precision machined parts and surface finish inspection
Materials science and quality control
Forensic examination of reflective evidence
Digital documentation and photomicrography via trinocular port
