Olympus SZ-CHI SZ Coaxial Illuminator with 1/4 wave plate

🔬 Olympus SZ-CHI coaxial illuminator with λ/4 wave plate for SZ40, SZ60, and SZ1145 stereo microscopes
⚡ Coaxial (vertical) illumination — delivers light along the optical axis for even, shadow-free illumination of flat and reflective specimens
🎯 Integrated λ/4 wave plate — reduces glare and specular reflections on polished, metallic, and reflective specimen surfaces
🏭 Made in Japan by Olympus — guaranteed OEM fit, attaches to the back of the SZ40, SZ60, and SZ1145 zoom body
✅ SKU SZ-CHI — new condition, significant savings vs. list price of $2,700

🔧 Product Description

The Olympus SZ-CHI is a coaxial illuminator with an integrated λ/4 (quarter wave) plate for the Olympus SZ40, SZ60, and SZ1145 stereo zoom microscopes. It attaches to the back of the stereo microscope zoom body, delivering coaxial (vertical) illumination — light travels along the optical axis of the microscope, striking the specimen from directly above and reflecting straight back into the objective. This produces even, shadow-free illumination that is ideal for flat, polished, and reflective specimens where oblique or ring light illumination would create uneven shadows or hot spots. The integrated λ/4 wave plate is a standard feature of coaxial illuminators — it converts the linearly polarized light from the illuminator into circularly polarized light before it reaches the specimen, and converts the reflected light back to linear polarization before it reaches the observer. This eliminates the specular glare and bright reflections that would otherwise obscure surface detail on polished metals, semiconductors, PCBs, and other reflective specimens, revealing surface topography and features with high contrast and clarity. New condition at a significant discount from the list price.

🔎 Typical Applications

• Metallography and materials inspection — coaxial illumination with glare reduction for polished metal sections and surfaces
• Electronics and PCB inspection — even, shadow-free illumination of solder joints, traces, and components with specular glare eliminated
• Semiconductor and wafer inspection — coaxial illumination for surface defect detection on polished silicon and compound semiconductor wafers
• Gemology and mineralogy — coaxial illumination for faceted and polished specimen surfaces
• Any SZ40, SZ60, or SZ1145 application requiring even coaxial illumination with λ/4 glare reduction on reflective specimens

📊 Key Specifications

Universities and research institutions are welcome to purchase using an official purchase order. Please contact us to arrange PO-based ordering.