Olympus MS PLAN 2.5x Reflected Light Objective

Compact 2.5× plan objective for reflected light microscopy — ideal for wide-field industrial inspection.

• 🔬 2.5× Magnification, NA 0.07 — Extra-wide field of view for large-area specimen survey and overview imaging.
• 🧠 MS PLAN Optical Design — Delivers flat-field imaging for consistent focus across the entire field of view.
• 📏 Working Distance (5 mm) — Adequate clearance for standard industrial specimens.
• ⚙️ RMS Thread Mount — Standard threaded mount for broad microscope compatibility.
• ✨ Condition: Excellent — High-quality optics with full performance specifications.

🔧 Product Description

The Olympus MS PLAN 2.5× Reflected Light Objective is a compact, high-performance objective designed for wide-field industrial microscopy applications. As part of Olympus's MS PLAN series, this objective combines low magnification with plan (flat-field) optical correction, making it an essential tool for initial specimen survey, large-area inspection, and capturing context before zooming in to higher magnifications.

At 2.5× magnification with a numerical aperture of 0.07, this objective provides an extra-wide field of view that is ideal for examining large specimens, locating regions of interest, and understanding the overall context of your sample. The low magnification combined with excellent depth of field makes it particularly well-suited for specimens with significant surface relief or for applications requiring a comprehensive overview.

The plan optical design ensures that the entire field of view is in focus simultaneously, from center to edge. This flat-field correction is critical for digital imaging, photomicrography, and quantitative analysis, ensuring that measurements and observations are accurate across the entire field of view.

With a working distance of 5 mm, this objective provides adequate clearance for standard industrial specimens while maintaining excellent optical performance. The compact MS PLAN design makes it an economical choice for routine industrial microscopy applications where the highest level of aberration correction is not required.

Compatible with microscopes via standard RMS thread mount, this objective integrates seamlessly into metallurgical, materials science, and quality control workflows.

🔎 Typical Applications

• Large-area specimen survey and overview imaging
• Metallurgical analysis and materials characterization
• Quality control and routine inspection
• Industrial reflected light microscopy
• Locating regions of interest before higher magnification

📊 Key Specifications

💼 University Purchase Orders Accepted

Thank you for viewing! Please contact us with any questions about this objective or your specific industrial microscopy requirements.