Olympus MS PLAN 1.5x Reflected Light Objective

Ultra-low magnification 1.5× plan objective — ideal for maximum field of view and specimen overview.

• 🔬 1.5× Magnification, NA 0.04 — Maximum field of view for complete specimen overview and context.
• 🧠 MS PLAN Optical Design — Delivers flat-field imaging for consistent focus across the entire field of view.
• 📏 Working Distance (2 mm) — Compact design optimized for low-magnification overview imaging.
• ⚙️ RMS Thread Mount — Standard threaded mount for broad microscope compatibility.
• ✨ Condition: Excellent — High-quality optics with full performance specifications.

🔧 Product Description

The Olympus MS PLAN 1.5× Reflected Light Objective is an ultra-low magnification objective designed for maximum field of view applications in industrial microscopy. As part of Olympus's MS PLAN series, this objective combines the lowest practical magnification with plan (flat-field) optical correction, making it an essential tool for complete specimen overview, large-area documentation, and understanding the full context of your sample.

At 1.5× magnification with a numerical aperture of 0.04, this objective provides the widest possible field of view, allowing you to see the entire specimen or large portions of it in a single view. This ultra-low magnification is ideal for initial specimen examination, locating specific features or regions of interest, and capturing context that would be impossible at higher magnifications. The extremely low magnification combined with exceptional depth of field makes it particularly well-suited for specimens with significant surface relief or three-dimensional features.

The plan optical design ensures that the entire field of view is in focus simultaneously, from center to edge. This flat-field correction is critical for digital imaging, photomicrography, and creating panoramic views of large specimens, ensuring that the entire image is sharp and usable.

The compact design with a 2 mm working distance is optimized for low-magnification overview imaging. While the working distance is modest, it is appropriate for the intended use case of scanning and surveying specimens before moving to higher magnifications for detailed examination.

Compatible with microscopes via standard RMS thread mount, this objective integrates seamlessly into metallurgical, materials science, and quality control workflows where maximum field of view is essential.

🔎 Typical Applications

• Maximum field of view specimen overview
• Large specimen documentation and mapping
• Initial specimen survey and feature location
• Quality control and routine inspection
• Industrial reflected light microscopy

📊 Key Specifications

💼 University Purchase Orders Accepted

Thank you for viewing! Please contact us with any questions about this objective or your specific industrial microscopy requirements.