Olympus MPLANAPO 1.25X Reflected Light Microscope Objective

The Olympus MPLANAPO 1.25× Reflected Light Microscope Objective represents the pinnacle of ultra-low magnification microscopy optics. As a plan apochromat objective, it delivers the highest level of optical correction available, combining perfectly flat-field imaging with exceptional chromatic aberration correction across the entire visible spectrum. This makes it an essential tool for applications requiring maximum field of view, accurate color reproduction, precise measurements, and publication-quality imaging.

At 1.25× magnification with a numerical aperture of 0.04, this objective provides the widest possible field of view, allowing you to see the entire specimen or large portions of it in a single view. This ultra-low magnification is ideal for initial specimen examination, locating specific features or regions of interest, and capturing context that would be impossible at higher magnifications. The extremely low magnification combined with exceptional depth of field makes it particularly well-suited for large specimens, three-dimensional samples, or applications requiring a comprehensive overview.

The plan apochromat design ensures that chromatic aberration is corrected for three wavelengths (red, green, and blue) and spherical aberration is corrected for two wavelengths, delivering images with exceptional color fidelity and sharpness. The flat-field correction ensures that the entire field of view is in focus simultaneously, from center to edge — a critical advantage for digital imaging, photomicrography, creating panoramic views, and quantitative analysis of large specimens.

The compact design with a 3.6 mm working distance is optimized for ultra-low magnification overview imaging. While the working distance is modest, it is appropriate for the intended use case of scanning and surveying specimens before moving to higher magnifications for detailed examination.

Compatible with microscopes via standard RMS thread mount, this objective integrates seamlessly into metallurgical, materials science, geology, and research workflows where maximum field of view combined with the highest optical quality is essential.