Olympus IX3-RFA Straight Illuminator for IX53, IX73, IX83

In stock

SKU: N4245200

Regular price $1,850.00

KEY FEATURES

  • Olympus IX3-RFA reflected light illuminator — brightfield and darkfield capable, for IX53, IX73, and IX83 inverted microscopes
  • Straight (direct) illuminator design — delivers epi-illumination through the objective from above the specimen on an inverted platform
  • Brightfield and darkfield reflected light — enables opaque specimen inspection and surface analysis on IX series inverted microscopes
  • Made in Japan by Olympus — guaranteed OEM fit and optical alignment
  • SKU N4245200 — new condition, compatible with IX53, IX73, and IX83
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Product Overview

The Olympus IX3-RFA is a straight reflected light illuminator for the Olympus IX53, IX73, and IX83 inverted microscopes, providing brightfield and darkfield epi-illumination capability on an inverted platform. While inverted microscopes are primarily designed for transmitted light observation of cells and tissues in culture dishes from below, the IX3-RFA adds reflected light illumination from above — directing light through the objective onto the specimen surface and collecting the reflected light back through the same objective. This enables the IX series inverted microscope to be used for reflected light inspection of opaque specimens, surface analysis, and materials characterization without requiring a separate upright reflected light microscope. In brightfield mode, the directly reflected beam is collected for standard surface observation; in darkfield mode, the direct beam is blocked and only obliquely scattered light is collected, revealing surface defects, grain boundaries, and fine topographic features with high contrast against a dark background. Built to Olympus factory specifications (SKU N4245200), the IX3-RFA ensures precise optical alignment and consistent illumination performance on IX53, IX73, and IX83 platforms.

Technical Specifications

Olympus Part Number N4245200
Model IX3-RFA
Type Straight Reflected Light Illuminator
Illumination Modes Brightfield and Darkfield (epi-illumination)
Compatible Microscopes Olympus IX53, IX73, IX83
Country of Origin Japan
HS Code 901190
Condition New / OEM

Microscope Compatibility

Typical Applications

Materials science and metallography — reflected light inspection of polished sections on an inverted platform
Electronics and semiconductor inspection — surface defect detection on wafers and components using an IX series inverted microscope
Multi-modal workflows — combining transmitted fluorescence/phase contrast with reflected light inspection on the same IX53, IX73, or IX83 system
Darkfield reflected light — high-contrast surface feature detection on opaque or semi-opaque specimens
Research applications requiring reflected light capability on an existing IX series inverted microscope infrastructure
  • Designed for Mixed-Brand Lab Environments

    Olympus, Nikon, Zeiss, Leica components in one place

  • Quality-Verified New & Pre-Owned Equipment

    Professionally sourced and verified for performance

  • Backed by Spach Optics Warranty & Support

    Ideal for labs using multiple microscope platforms

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    Guidance on compatibility, selection, and configuration