Olympus CX31-P Polarized Light Microscope
Regular price
$4,500.00
Sale price
$4,500.00
Regular price
$7,995.00
save $3,495.00
The Olympus CX31-P Polarized Light Microscope is a fully configured, research-grade polarizing microscope built for birefringence analysis, crystal examination, and materials characterization — complete with a rotating stage, compensator system, and a comprehensive set of strain-free optics.
KEY FEATURES
- 360° rotating ball-bearing polarized light stage for precise specimen orientation and extinction angle measurement
- 4x, 10x, 20x, and 40x Plan objectives covering the full magnification range for polarized light work
- Strain-free condenser with rotatable polarizer for accurate birefringence and interference color analysis
- U-ANT analyzer, U-KPA intermediate attachment, U-TAD compensator adapter, and U-TP530 first-order red gypsum plate for advanced compensator and retardation measurements
- Binocular head with WHB 10x widefield eyepieces — crosshair reticle installed in right eyepiece for precise alignment
- Condition: Refurbished, Excellent — inspected and performance-verified
Backed by Spach Optics Warranty
Secure Packaging & Reliable Delivery
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Technical Specifications
| Frame | Olympus CX31-P |
| Head | Binocular |
| Eyepieces | WHB 10x Widefield (crosshair reticle in right eyepiece) |
| Objectives | Plan 4x, Plan 10x, Plan 20x, Plan 40x |
| Stage | 360° rotating ball-bearing polarized light stage |
| Condenser | Strain-free with rotatable polarizer |
| Analyzer | U-ANT |
| Intermediate Attachment | U-KPA |
| Compensator Adapter | U-TAD |
| Compensator Plate | U-TP530 First-Order Red Full-Wave Gypsum Plate |
| Condition | Refurbished, Excellent |
| SKU | CX31P |
| Country of Origin | Japan |
| Weight | 35 lbs |
Microscope Compatibility
Typical Applications
Mineralogy and petrology thin section analysis
Crystal structure and birefringence examination
Interference color and retardation measurement with compensators
Pharmaceutical polymorphism and crystal habit analysis
Fiber identification and forensic materials analysis
Quality control of optically active materials and coatings
