Olympus BX51-P Reflected and Transmitted Light Polarized Light Microscope

In stock

SKU: BX51P-TR

Regular price $19,500.00
Sale price $19,500.00 Regular price $39,950.00 save $20,450.00
The Olympus BX51-P Transmitted & Reflected Light Research Grade Polarizing Microscope is Olympus's flagship dual-mode polarizing platform — fully loaded and in as-new working order, combining transmitted and reflected light polarized light capability, conoscopic observation, brightfield/darkfield reflected illumination, and a complete compensator-ready optical train for the most demanding research and industrial applications.

KEY FEATURES

  • 5x, 10x, 20x, and 50x Plan Fluorite objectives for high-contrast, flat-field polarized light imaging in both transmitted and reflected modes
  • Dual 12V 100W quartz halogen lamphouses — one for transmitted light, one for reflected light (BX-RLA2 with BF/DF slider)
  • U-CPA conoscopic polarizing intermediate piece for conoscopic observation and optical axis determination
  • U-SRP 360° rotating ball-bearing stage with 3-point centering, 1° graduation, 45° click-stop, and lockable position
  • U-TR30-2 trinocular head with 3-position light path (100:0 / 80:20 / 0:100) for flexible observation and documentation
  • Condition: Excellent, as-new working order — includes power cord, dust cover, and instruction manual
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Product Overview

The Olympus BX51-P is the flagship dual transmitted and reflected light polarizing microscope from Olympus, and this fully loaded configuration represents one of the most versatile and capable polarized light systems available. The BX51TRF frame supports both transmitted and reflected light optical paths simultaneously, with a dedicated 12V 100W quartz halogen lamphouse for each — enabling seamless switching between transmitted light polarized light microscopy for thin sections and reflected light polarized light microscopy for opaque and polished specimens. The BX-RLA2 reflected light illuminator with BF/DF slider adds brightfield and darkfield reflected light capability, making this system equally at home in mineralogy, metallurgy, and materials science. The U-CPA conoscopic intermediate piece enables direct observation of interference figures for optical axis determination and crystal system identification. The U-SRP rotating ball-bearing stage with 3-point centering, 1° graduation, and 45° click-stop provides precise extinction angle measurement and crystal orientation analysis. The U-POC strain-free condenser with 360° rotatable polarizer and swing-out top lens, U-AN360P rotatable lockable analyzer, and U-PO3 polarizer complete the full polarized light optical train. The U-P4RE quadruple centerable nosepiece accommodates four Plan Fluorite objectives — 5x, 10x, 20x, and 50x — covering the full magnification range for both transmitted and reflected polarized light work. WHN 10x widefield eyepieces with crosshair reticle and scale in the right eyepiece support precise measurement and alignment. In excellent, as-new working condition, this system ships complete with power cord, dust cover, and instruction manual.

Technical Specifications

Frame Olympus BX51TRF (transmitted & reflected light)
Reflected Light Illuminator BX-RLA2 with BF/DF slider
Illumination 2x U-LH100 12V 100W quartz halogen lamphouses
Head U-TR30-2 trinocular (100:0 / 80:20 / 0:100)
Eyepieces WHN 10x Widefield (crosshair reticle with scale in right eyepiece)
Nosepiece U-P4RE quadruple centerable
Objectives Plan Fluorite 5x, 10x, 20x, 50x
Stage U-SRP 360° rotating ball-bearing, 3-point centering, 1° graduation, 45° click-stop, lockable
Mechanical Stage U-FMP attachable with XY knurled controls
Condenser U-POC strain-free, 360° rotatable polarizer, swing-out top lens
Analyzer U-AN360P rotatable, lockable slider
Polarizer U-PO3
Conoscopic Attachment U-CPA conoscopic polarizing intermediate piece
Accessories Included Power cord, dust cover, instruction manual
Condition Excellent, as-new working order
SKU BX51P-TR
Country of Origin Japan
Weight 65 lbs

Microscope Compatibility

Typical Applications

Mineralogy and petrology thin section analysis with transmitted and reflected light
Conoscopic observation for optical axis determination and crystal system identification
Reflected light polarized light microscopy of opaque and polished ore specimens
Brightfield and darkfield reflected light inspection of metals and alloys
Pharmaceutical polymorphism, crystal habit, and thin film analysis
Forensic fiber identification and birefringent materials characterization
  • Designed for Mixed-Brand Lab Environments

    Olympus, Nikon, Zeiss, Leica components in one place

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    Professionally sourced and verified for performance

  • Backed by Spach Optics Warranty & Support

    Ideal for labs using multiple microscope platforms

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