Olympus BX41-P Polarized Light Microscope
Regular price
$13,700.00
Sale price
$13,700.00
Regular price
$25,900.00
save $12,200.00
The Olympus BX41-P Research Grade Polarized Light Microscope is a fully loaded, research-grade polarizing system in as-new working order — combining UIS2 infinity-corrected strain-free optics, conoscopic capability, and a complete compensator system for demanding mineralogy, materials science, forensic analysis, and birefringence research.
KEY FEATURES
- 4x, 10x, 20x, and 40x strain-free POL objectives for artifact-free polarized light imaging across the full magnification range
- U-CPA conoscopic observation attachment with Bertrand field stop for interference figure observation and optical axis determination
- U-SRP 360° rotating ball-bearing stage with 3-point centering for precise extinction angle measurement and crystal orientation analysis
- Complete compensator system: U-TAD adapter and U-TP530 first-order red gypsum plate for retardation and interference color analysis
- U-TR30-2 trinocular head with 3-position light path (100:0 / 80:20 / 0:100) for flexible observation and documentation
- Condition: Excellent, as-new working order
Backed by Spach Optics Warranty
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Technical Specifications
| Frame | Olympus BX41 |
| Optical System | UIS2 infinity-corrected, strain-free |
| Head | U-TR30-2 trinocular (100:0 / 80:20 / 0:100) |
| Eyepieces | WHN 10x Widefield (crosshair reticle with scale in right eyepiece) |
| Nosepiece | U-P4RE quadruple centerable |
| Objectives | Strain-free POL 4x, 10x, 20x, 40x |
| Stage | U-SRP 360° rotating ball-bearing with 3-point centering |
| Mechanical Stage | U-FMP attachable with XY knurled controls |
| Condenser | U-POC strain-free, 360° rotatable polarizer, swing-out top lens |
| Analyzer | U-AN360P 360° dial-rotatable, lockable |
| Conoscopic Attachment | U-CPA with Bertrand field stop |
| Compensator System | U-TAD adapter + U-TP530 first-order red gypsum plate |
| Condition | Excellent, as-new working order |
| SKU | BX41P |
| Country of Origin | Japan |
| Weight | 65 lbs |
Microscope Compatibility
Typical Applications
Mineralogy and petrology thin section analysis with conoscopic observation
Crystal structure, birefringence, and optical axis determination
Interference color and retardation measurement with compensators
Forensic fiber identification and birefringent materials analysis
Pharmaceutical polymorphism and crystal habit analysis
Thin film, polymer, and particulate identification
