Olympus BX-RLA2 Brightfield Darkfield Reflected Light Illuminator

In stock

SKU: BX-RLA2

Regular price $2,300.00

KEY FEATURES

  • Olympus BX-RLA2 reflected light illuminator — brightfield and darkfield capable, for Olympus BX2 series upright microscopes
  • Dual-mode epi-illumination — vertically guides light through the objective onto the specimen surface in both brightfield and darkfield modes
  • Incident light design — light is delivered through the objective and reflected light is collected back through the same objective for observation
  • Made in Japan by Olympus — guaranteed OEM fit and optical alignment for BX2 series
  • SKU BX-RLA2 / Cat. 5-UR720 — new condition
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Product Overview

The Olympus BX-RLA2 is a reflected light illuminator for the Olympus BX2 series of upright microscopes, designed for incident light observation of opaque specimens. In reflected light (epi-illumination) mode, the illumination lamp light is vertically guided through the objective and directed onto the specimen surface; the light reflected from the specimen is then collected back through the same objective and routed to the eyepieces or camera for observation. This configuration is fundamentally different from transmitted light microscopy and is the standard approach for examining opaque materials that cannot be illuminated from below. The BX-RLA2 supports both brightfield and darkfield reflected light modes: brightfield collects the directly reflected beam for standard surface observation, while darkfield blocks the direct beam and collects only obliquely scattered light, revealing surface defects, grain boundaries, and fine topographic features with high contrast against a dark background. Built to Olympus factory specifications (catalog number 5-UR720), the BX-RLA2 ensures precise optical alignment and consistent illumination performance across both modes.

Technical Specifications

Olympus Part Number BX-RLA2
Catalog Number 5-UR720
Type Reflected Light Illuminator (Epi-illumination)
Illumination Modes Brightfield and Darkfield
Illumination Path Vertical incident light through objective
Compatible Microscopes Olympus BX2 series
Country of Origin Japan
HS Code 901190
Condition New / OEM

Microscope Compatibility

Typical Applications

Metallography — grain structure, phase identification, and surface analysis of polished metal sections
Semiconductor and electronics inspection — brightfield and darkfield surface defect detection on wafers and PCBs
Ceramics and materials science — reflected light examination of polished cross-sections and coatings
Geology and mineralogy — ore mineral identification and reflected light petrography
Industrial quality control on BX2 series platforms requiring multi-mode reflected light inspection
  • Designed for Mixed-Brand Lab Environments

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    Ideal for labs using multiple microscope platforms

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