Nikon CFI TU Plan Fluor 20x Reflected Light Objective
SKU: MUE12200
Regular price
$895.00
Sale price
$895.00
Regular price
$1,687.00
save $792.00
Nikon CFI TU Plan Fluor EPI 20x Reflected Light Objective
KEY FEATURES
- 20x Magnification – Versatile magnification for reflected light inspection
- Plan Fluor Optical Design – Flat field with enhanced chromatic correction
- High NA 0.45 – Strong light collection for bright, detailed images
- Long Working Distance 4.5mm – Comfortable clearance for surface inspection
- CFI60-2 Infinity-Corrected System – Compatible with Nikon CFI60 microscopes
- Excellent Condition – Flawless optics, inspected and tested
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Technical Specifications
| Magnification | 20x |
| Numerical Aperture (NA) | 0.45 |
| Working Distance (WD) | 4.5 mm |
| Optical System | CFI60-2 (infinity-corrected) |
| Illumination Type | Reflected light (EPI) |
| Parfocal Distance | 60 mm |
| Mounting Thread | M25 x 0.75 mm |
| Immersion Medium | Dry / Air |
| Cover Glass Thickness | 0 mm |
| Condition | Excellent, flawless optics |
Microscope Compatibility
| Microscope System | Nikon CFI60-2 infinity-corrected upright microscopes |
| Illumination | Reflected light (EPI) |
| Parfocal Distance | 60 mm |
| Mounting Thread | M25 x 0.75 mm |
Typical Applications
Reflected light brightfield microscopy
Surface inspection and materials analysis
Semiconductor and wafer inspection
Industrial quality control and failure analysis
Metallurgical and mineralogical examination
