Zeiss LD Epiplan-Neofluar 100x Brightfield Darkfield DIC Objective
Regular price
$1,500.00
Sale price
$1,500.00
Regular price
$4,900.00
save $3,400.00
Zeiss LD Epiplan 100X BD DIC Long Working Distance Microscope Objective for Reflected Light Microscopy
KEY FEATURES
- High-performance LD Epiplan objective for reflected light microscopy
- 100X magnification with 0.75 numerical aperture for exceptional resolution
- Multi-contrast capability: Brightfield, Darkfield, and DIC compatible
- Long 3mm working distance ideal for thick specimens and manipulation
- M27 thread compatible with Zeiss Axio series microscope systems
- Excellent condition with flawless optics
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Technical Specifications
| Model / Catalog Number | Zeiss LD Epiplan 100X BD DIC / 442885 |
| Magnification | 100X |
| Numerical Aperture (NA) | 0.75 |
| Optical Design | LD Epiplan, Infinity-Corrected |
| Illumination Type | Reflected light (epi-illumination) |
| Contrast Modes | Brightfield, Darkfield, DIC (Differential Interference Contrast) |
| Working Distance | 3mm (long working distance) |
| Thread Type | M27 (27mm metric thread) |
| Compatibility | Zeiss Axio series reflected light microscopes |
| Recommended Applications | Metallurgy, materials science, semiconductor inspection, multi-contrast imaging |
| Condition | Excellent, flawless optics |
Microscope Compatibility
Typical Applications
Metallurgical analysis and materials science with multiple contrast modes
Semiconductor wafer inspection and defect characterization
Industrial quality control and surface inspection
Failure analysis requiring brightfield, darkfield, and DIC imaging
Microstructural analysis and grain boundary examination
Printed circuit board (PCB) inspection with enhanced contrast
High-magnification imaging requiring long working distance
Multi-contrast reflected light microscopy for comprehensive analysis
