Zeiss LD Epiplan-Neofluar 100x Brightfield Darkfield DIC Objective

In stock

SKU: 442885

Regular price $1,500.00
Sale price $1,500.00 Regular price $4,900.00 save $3,400.00
Zeiss LD Epiplan 100X BD DIC Long Working Distance Microscope Objective for Reflected Light Microscopy

KEY FEATURES

  • High-performance LD Epiplan objective for reflected light microscopy
  • 100X magnification with 0.75 numerical aperture for exceptional resolution
  • Multi-contrast capability: Brightfield, Darkfield, and DIC compatible
  • Long 3mm working distance ideal for thick specimens and manipulation
  • M27 thread compatible with Zeiss Axio series microscope systems
  • Excellent condition with flawless optics
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Product Overview

The Zeiss LD Epiplan 100X BD DIC is a premium long working distance objective engineered specifically for reflected light (epi-illumination) microscopy applications requiring exceptional working distance, multiple observation techniques, and high-magnification imaging. As part of Zeiss's LD (Long Distance) Epiplan series, this objective combines 100X magnification with a 3mm working distance—significantly longer than standard 100X objectives—making it ideal for examining thick specimens, wafers, and samples requiring manipulation or measurement at high magnification. The "BD DIC" designation indicates compatibility with Brightfield, Darkfield, and Differential Interference Contrast (DIC) imaging modes, making this objective exceptionally versatile for revealing different types of surface features, defects, and microstructural details. With a high numerical aperture of 0.75, this objective provides outstanding resolution for detailed examination of metal surfaces, semiconductors, and other reflective specimens, while the long working distance provides ample clearance for DIC prisms, polarizers, and other optical accessories. The infinity-corrected optical design ensures compatibility with modern Zeiss Axio microscope systems and allows for the insertion of optical components without compromising image quality. This objective is in excellent condition with flawless optics, offering professional-grade multi-contrast performance at high magnification with extended working distance.

Technical Specifications

Model / Catalog Number Zeiss LD Epiplan 100X BD DIC / 442885
Magnification 100X
Numerical Aperture (NA) 0.75
Optical Design LD Epiplan, Infinity-Corrected
Illumination Type Reflected light (epi-illumination)
Contrast Modes Brightfield, Darkfield, DIC (Differential Interference Contrast)
Working Distance 3mm (long working distance)
Thread Type M27 (27mm metric thread)
Compatibility Zeiss Axio series reflected light microscopes
Recommended Applications Metallurgy, materials science, semiconductor inspection, multi-contrast imaging
Condition Excellent, flawless optics

Microscope Compatibility

Typical Applications

Metallurgical analysis and materials science with multiple contrast modes
Semiconductor wafer inspection and defect characterization
Industrial quality control and surface inspection
Failure analysis requiring brightfield, darkfield, and DIC imaging
Microstructural analysis and grain boundary examination
Printed circuit board (PCB) inspection with enhanced contrast
High-magnification imaging requiring long working distance
Multi-contrast reflected light microscopy for comprehensive analysis
  • Designed for Mixed-Brand Lab Environments

    Olympus, Nikon, Zeiss, Leica components in one place

  • Quality-Verified New & Pre-Owned Equipment

    Professionally sourced and verified for performance

  • Backed by Spach Optics Warranty & Support

    Ideal for labs using multiple microscope platforms

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    Most orders ship quickly from within the United States

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    Guidance on compatibility, selection, and configuration