Schott A08907 Lightline Fiber Optic Line Light 7.0" x 0.029"
Regular price
$955.00
The Schott A08907 Lightline is a precision fiber optic line light delivering a narrow, uniform 7.0" × 0.029" illuminated line — designed for Schott KL series and ColdVision cold light sources and engineered for machine vision, web inspection, line-scan imaging, and any application requiring a long, precisely defined, high-intensity line of light.
KEY FEATURES
- 7.0" × 0.029" (178mm × 0.74mm) illuminated line — a long, precisely defined, narrow line of light for wide-field line-scan imaging and structured illumination
- High-intensity fiber optic construction for consistent, bright, uniform line illumination from Schott KL series and ColdVision cold light sources
- Ideal for line-scan cameras and machine vision systems requiring a wide, uniform, high-contrast line of illumination across large inspection fields
- Cold light (IR-free) illumination — protects heat-sensitive specimens, components, and materials during extended inspection runs
- 🇩🇪 Schott quality, made in Germany — precision fiber optic construction for consistent line uniformity and long service life
- New — part number A08907
Backed by Spach Optics Warranty
Secure Packaging & Reliable Delivery
People-Powered Support
Technical Specifications
| Part Number | A08907 |
| Type | Fiber optic line light (Lightline) |
| Illuminated Line Dimensions | 7.0" × 0.029" (178mm × 0.74mm) |
| Compatible Light Sources | Schott KL series, ColdVision cold light sources |
| Illumination Type | Cold light (IR-free), uniform line |
| Country of Origin | Japan |
| Condition | New |
| SKU | A08907 |
| Weight | 2 lbs |
Microscope Compatibility
Typical Applications
Wide-field line-scan camera illumination for machine vision and automated inspection
Web, film, and sheet inspection in production environments
Large-format surface defect detection on flat materials
Barcode, label, and document reading illumination over wide scan widths
Dimensional measurement and gauging with structured line light
3D profilometry and structured light scanning of large surfaces
