Schott A08580 Dual Lightline Fiber Optic Line Light 3.0" x 0.018"
Regular price
$950.00
The Schott A08580 Dual Lightline is a precision dual-output fiber optic line light delivering two simultaneous, parallel 3.0" × 0.018" illuminated lines — designed for Schott KL series and ColdVision cold light sources and engineered for machine vision and inspection applications requiring two precisely defined, co-planar lines of light for structured illumination, 3D profilometry, and dual-line inspection techniques.
KEY FEATURES
- Dual output: two simultaneous 3.0" × 0.018" (76mm × 0.46mm) illuminated lines — two precisely defined, parallel lines of light from a single fiber optic light source connection
- Enables dual-line structured illumination techniques — ideal for 3D surface profilometry, height measurement, and inspection methods that require two reference lines simultaneously
- High-intensity fiber optic construction for consistent, bright, uniform line illumination across both 3-inch lines without hot spots or intensity falloff
- Cold light (IR-free) illumination — protects heat-sensitive specimens and components during extended inspection runs
- 🇩🇪 Schott quality, made in Germany — precision fiber optic construction for consistent dual-line uniformity and long service life
- New — part number A08580
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Technical Specifications
| Part Number | A08580 |
| Type | Dual fiber optic line light (Dual Lightline) |
| Output Configuration | Two simultaneous parallel illuminated lines |
| Illuminated Line Dimensions (each) | 3.0" × 0.018" (76mm × 0.46mm) |
| Compatible Light Sources | Schott KL series, ColdVision cold light sources |
| Illumination Type | Cold light (IR-free), uniform dual line |
| Country of Origin | Germany |
| Condition | New |
| SKU | A08580 |
| Weight | 1 lb |
Microscope Compatibility
Typical Applications
3D surface profilometry and height measurement using dual structured line illumination
Machine vision inspection requiring two simultaneous reference lines
Surface defect detection with dual-line contrast enhancement techniques
Dimensional measurement and gauging using two parallel structured light lines
Specialized machine vision algorithms requiring a two-line illumination pattern
Research and development applications in structured light imaging
