Schott 400.255 VisiLED Brightfield Ringlight 66mm
Regular price
$953.00
The Schott 400.255 VisiLED Brightfield Ringlight (66mm) is a professional-grade LED ring illuminator from Schott's VisiLED system — delivering high-intensity, homogeneous brightfield ring illumination for stereo microscopes with 66mm objective diameters, with the precision LED performance and controllability of the VisiLED platform for demanding inspection, research, and imaging applications.
KEY FEATURES
- VisiLED brightfield ring illumination — high-intensity, homogeneous LED ring light optimized for brightfield stereo microscopy and surface inspection
- 66mm inner diameter — fits most stereo microscope objectives directly
- VisiLED system compatibility — designed for use with Schott VisiLED MC 1500 and compatible VisiLED controllers for precise, programmable illumination control
- High-brightness LED construction for consistent, stable illumination with long LED service life and low power consumption
- 🇩🇪 Schott quality, made in Germany — precision LED engineering for demanding laboratory and industrial applications
- New — catalog number 400.255
Backed by Spach Optics Warranty
Secure Packaging & Reliable Delivery
People-Powered Support
Technical Specifications
| Catalog Number | 400.255 |
| System | Schott VisiLED |
| Type | LED brightfield ringlight |
| Inner Diameter | 66mm |
| Illumination Pattern | Homogeneous brightfield ring |
| Compatible Controllers | Schott VisiLED MC 1500 and compatible VisiLED controllers |
| Country of Origin | Germany |
| Condition | New |
| SKU | 400.255 |
| Weight | 2 lbs |
Microscope Compatibility
Typical Applications
Stereo microscope brightfield surface illumination for biological and materials specimens
Electronics and PCB inspection with homogeneous ring illumination
Quality control and incoming inspection with precise, controllable LED lighting
Machine vision and automated optical inspection (AOI) systems
Research and imaging applications requiring stable, programmable illumination
Gemology and materials surface examination
