Olympus WI-ANIR Analyzer for Reflected Light for 900NM

The Olympus WI-ANIR is a near-infrared (NIR) analyzer for reflected light polarized microscopy, optimized for operation at 900nm wavelength. In polarized light microscopy, the analyzer is placed in the reflected light path after the specimen to select a specific polarization state of the reflected light — enabling contrast mechanisms such as polarized reflected light, DIC, and birefringence analysis. The WI-ANIR extends this capability into the near-infrared at 900nm, which is essential for applications where visible light is absorbed, scattered, or otherwise unsuitable — most notably in semiconductor and silicon wafer inspection, where silicon is transparent at NIR wavelengths but opaque to visible light. This allows subsurface features, defects, and structures within silicon devices to be imaged using reflected NIR polarized light. The WI-ANIR is compatible with Olympus BX, GX, and MX series microscopes, covering the full range of research, industrial, and semiconductor inspection platforms. Built to Olympus factory specifications, it ensures precise polarization performance at the 900nm design wavelength.