Olympus U-DICR DIC Nomarski Prism Slider

Olympus U-DICR DIC Nomarski Prism Slider — Reflected Light

Nomarski DIC prism slider for reflected light differential interference contrast microscopy — ideal for surface topography imaging, materials science, and semiconductor inspection requiring high-contrast 3D-like surface detail.

• 🔬 Reflected Light DIC — Nomarski prism for differential interference contrast in reflected light mode
• 🌊 Surface Topography — reveals surface height variations and texture with exceptional contrast
• ✅ Compatible with Olympus BX reflected light DIC systems
• 🎓 Excellent with Flawless Optics

🔧 Product Description

The Olympus U-DICR is a Nomarski DIC prism slider designed for reflected light differential interference contrast microscopy on Olympus BX series microscopes. In reflected light DIC, the Nomarski prism splits the illuminating beam into two slightly laterally displaced beams that reflect off the specimen surface and recombine, producing interference contrast that reveals surface height gradients as bright and dark shadows. This creates a striking pseudo-3D relief image of surface topography without the need for staining or surface preparation. The U-DICR is essential for high-contrast imaging of polished metal surfaces, semiconductor wafers, thin films, and other reflective specimens where surface texture and topography are critical.

🔎 Typical Applications

• Surface topography and texture imaging of polished metals
• Semiconductor wafer and thin film inspection
• Metallographic surface analysis
• Precision machined surface quality control
• Thin film and coating characterization
• Materials science and failure analysis

📊 Key Specifications

🎓 University purchase orders accepted. Contact us for volume pricing and institutional procurement options.