Olympus U-CTB Thick Berek Compensator
Regular price
$2,700.00
Precision Berek compensator for quantitative retardation measurement in polarized light microscopy — ideal for materials science, geological analysis, and advanced birefringence characterization requiring accurate optical path difference measurement.
KEY FEATURES
- Quantitative Retardation Measurement — measures optical path difference of birefringent specimens with high precision
- Thick Berek Design — extended retardation range for measurement of strongly birefringent materials
- Compatible with Olympus BX and UIS2 microscope systems
- New condition
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Technical Specifications
| Type | Thick Berek Compensator |
| Function | Quantitative optical path difference measurement |
| Compatibility | Olympus BX and UIS2 series microscopes |
| SKU | OLYMPUS-U-CTB |
| Condition | New |
Microscope Compatibility
Typical Applications
Quantitative birefringence and retardation measurement
Mineral identification and optical crystallography
Polymer and liquid crystal characterization
Stress and strain analysis in optical materials
Advanced geological thin section analysis
Research-grade polarized light microscopy
