Olympus SLMPlan N 50X Epi Objective | 0.45 NA Super Long Working Distance, Infinity Corrected
SKU: N2246500
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Super long working distance 50ร Plan Achromat objective for brightfield and inspection imaging.
- ๐ฌ 50ร Magnification, NA 0.35 โ Strong detail for high-magnification imaging.
- ๐ Ultra-Long Working Distance (~18 mm) โ Exceptional clearance for thick samples and tooling.
- ๐ง Plan Achromat Correction โ Flat field and reduced optical aberrations for consistent imaging.
- ๐ก High Transmission (400โ700 nm) โ Bright, even illumination throughout the visible spectrum.
- โ๏ธ Standard RMS Thread Mount โ Compatible with upright research microscopes & inspection stands.
๐งช Product Description
The Olympus SLMPLN 50ร Super Long Working Distance Objective is a precision microscope objective designed for applications where extra space between the lens and the specimen is essential. With 50ร magnification and a numerical aperture of 0.35, this objective provides detailed imaging while maintaining a notably long working distance of approximately 18 mm, making it especially useful for industrial inspection, materials analysis, and imaging thick samples.
Its Plan Achromat optical design offers excellent flat-field performance with minimized chromatic and spherical aberrations, resulting in consistent clarity and contrast across the entire field of view. The design also delivers high transmission (>90%) in the visible range (400โ700 nm), making it ideal for brightfield microscopy and general imaging tasks that benefit from bright, high-contrast images.
The super long working distance is a significant advantage when imaging larger objects, working with auxiliary devices like manipulators or probes, or inspecting nonstandard sample holders. This makes the SLMPLN 50ร objective well suited for electronic assembly inspection, materials science, quality assurance labs, and other environments where clearance and image fidelity matter.
Compatible with standard RMS-threaded microscopes, this Olympus objective integrates seamlessly with many upright research microscope stands and inspection systems.
๐ Typical Applications
- Brightfield and transmitted light microscopy
- Industrial and materials inspection
- Quality control imaging
- Imaging thick or uneven specimens
- Large sample documentation
๐ Key Specifications
|
Specification |
Details |
|
Magnification |
50ร |
|
Numerical Aperture (NA) |
0.35 |
|
Optical Correction |
Plan Achromat |
|
Working Distance |
~18 mm |
|
Wavelength Range |
400โ700 nm |
|
Transmission |
>90% in visible band |
|
Field Number |
~26.5 mm |
|
Mount |
RMS (20.32 ร 36 TPI) |
|
Parfocal Length |
~45 mm |
|
Immersion Medium |
Air/Dry |
|
Condition |
New |
