Olympus Plan N 4x Polarized Light Microscope Objective

In stock

SKU: N1477500

Regular price $325.00
Specialized 4Γ— plan objective for polarized light microscopy β€” ideal for low-magnification polarization analysis, geological sample observation, and materials characterization requiring strain-free optics.

KEY FEATURES

  • 4Γ— Magnification β€” Low magnification with excellent field of view for sample survey and overview imaging.
  • Polarized Light Optimized β€” Strain-free optical design for accurate polarization microscopy.
  • Plan Correction β€” Flat-field imaging from center to edge for accurate documentation.
  • Infinity Corrected β€” Modern optical design for compatibility with advanced microscopy techniques.
  • Long Working Distance β€” Generous clearance for thick specimens and sample manipulation.
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Product Overview

The Olympus Plan N 4Γ— Polarized Light Objective is a specialized lens engineered specifically for polarized light microscopy applications. With strain-free optical construction and plan correction, this objective enables accurate observation of birefringent materials, crystalline structures, and optical properties at low magnification, making it essential for geological analysis, materials science, and any application requiring polarization microscopy.

Polarized light microscopy requires objectives with strain-free optical construction. Standard objectives may contain internal stresses in the glass elements that can affect polarized light, introducing unwanted birefringence and interfering with accurate observation of sample optical properties. The Plan N polarized light series is specifically designed with strain-free optics, ensuring that the objective itself does not introduce artifacts or interfere with polarization analysis.

At 4Γ— magnification, this objective provides a large field of view ideal for sample survey, locating regions of interest, and obtaining overview images of geological thin sections, crystalline materials, and other birefringent specimens. The low magnification enables efficient navigation across large samples and provides context for higher-magnification polarization observations.

Plan correction provides flat-field imaging with minimal curvature of field, maintaining sharp focus from the center to the edge of the field of view. This is essential for polarized light microscopy where uniform image quality across the entire field is required for accurate observation of extinction patterns, interference colors, and other optical properties that are diagnostic for mineral identification and materials characterization.

The long working distance typical of 4Γ— objectives provides generous clearance for thick specimens such as geological thin sections, petrographic samples, and materials specimens. This clearance also accommodates accessories such as compensators, retardation plates, and other polarization accessories that may be positioned near the sample.

As an infinity-corrected objective, this lens is designed for modern microscope systems where the image is formed at infinity, allowing the insertion of optical components such as polarizers, analyzers, and compensators in the parallel light path without introducing aberrations. This makes it fully compatible with polarized light microscopy techniques including orthoscopic observation, conoscopic observation, and quantitative polarization analysis.

Designed for use with Olympus BX, CX, and IX series polarizing microscopes, this objective integrates seamlessly with polarization accessories and provides the optical performance required for geological analysis, materials science, and industrial quality control applications. The robust construction and precision Japanese manufacturing ensure reliable performance in demanding research and production environments.

Technical Specifications

Magnification 4Γ—
Optical Design Plan N (Plan, Polarized Light)
Field Flatness Plan (Flat-field)
Polarization Strain-Free Optics
Optical System Infinity Corrected
Working Distance Long (Typical for 4Γ—)
Thread Mount RMS (20.32 x 36 TPI)
Application Polarized Light Microscopy, Geology
Compatibility Olympus BX, CX, IX series polarizing microscopes
Country of Origin Japan
SKU N1477500

Microscope Compatibility

Typical Applications

Geological thin section analysis and petrography
Mineral identification and crystallography
Materials science and polymer analysis
Stress and strain analysis in materials
Pharmaceutical and chemical crystallography
Quality control of birefringent materials
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