Olympus MX-SIC8R Mechanical Stage 8"
Olympus MX-SIC8R Mechanical Stage 8"

Olympus MX-SIC8R Mechanical Stage 8"

In stock

SKU: MX-SIC8R

$8,400.00

KEY FEATURES

  • Large 8×8 inch stage — 210×210 mm stroke for precise positioning of large samples
  • 200mm wafer capacity — 189×189 mm transmitted light illumination area
  • Belt drive with grip clutch — smooth, backlash-free positioning with quick-release disengagement
  • Roller guide slide mechanism — stable, repeatable movement for demanding inspection workflows
  • Designed for Olympus MX61 & MX63 — semiconductor and FPD inspection microscopes
  • Condition: New — genuine Olympus stage
  • University purchase orders accepted
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Product Overview

The Olympus MX-SIC8R is a large-format mechanical stage engineered for the MX61 and MX63 industrial inspection microscopes, purpose-built for semiconductor wafer inspection, flat panel display (FPD) analysis, and large-sample circuit board examination. Its 210×210 mm stroke and 189×189 mm transmitted light illumination area accommodate wafers up to 200 mm in diameter with ease. The roller guide slide mechanism ensures smooth, stable movement, while the belt drive system eliminates rack-and-pinion backlash for precise, repeatable positioning. The grip clutch function allows the belt drive to be disengaged instantly for rapid sample repositioning — a critical feature in high-throughput inspection environments. At 8×8 inches, this stage provides the working area and mechanical precision that demanding industrial and research applications require. New condition, manufactured in Japan to Olympus's exacting standards.

Technical Specifications

Model MX-SIC8R
Stage Size 8×8 inches
Stroke 210×210 mm
Transmitted Light Area 189×189 mm
Max Wafer Size 200 mm diameter
Drive Mechanism Belt Drive (no rack)
Slide Mechanism Roller Guide
Clutch Grip Clutch (belt disengage)
Compatible Microscopes Olympus MX61, MX63
Condition New
Weight 50 lbs
Country of Origin Japan

Microscope Compatibility

Typical Applications

Semiconductor wafer inspection (up to 200mm diameter)
Flat panel display (FPD) substrate inspection
Printed circuit board (PCB) analysis and quality control
Large-format industrial sample inspection
Photomask and reticle examination

  • Designed for Mixed-Brand Lab Environments

    Olympus, Nikon, Zeiss, Leica components in one place

  • Quality-Verified New & Pre-Owned Equipment

    Professionally sourced and verified for performance

  • Backed by Spach Optics Warranty & Support

    Ideal for labs using multiple microscope platforms

  • Fast, Reliable U.S. Shipping

    Most orders ship quickly from within the United States

  • Expert Support from Optical Specialists

    Guidance on compatibility, selection, and configuration