Olympus MPlanFL N 20X Epi Objective | 0.40 NA, BD, Infinity Corrected

In stock

SKU: N5744300

Regular price $1,350.00
Sale price $1,350.00 Regular price $1,550.00 save $200.00
Premium 20× objective with brightfield and darkfield capability — ideal for industrial inspection and materials science applications.

KEY FEATURES

  • 20× Magnification, NA 0.45 — High resolution for detailed imaging and defect detection.
  • Brightfield/Darkfield (BD) Capability — Dual-mode imaging for enhanced contrast and defect detection on reflective surfaces.
  • Working Distance (3 mm) — Adequate clearance for standard industrial specimens.
  • MPLFLN Plan Semi-Apochromat Design — Delivers flat-field imaging with excellent color correction.
  • M26 Thread Mount — Compatible with Olympus industrial microscope systems.
Backed by Spach Optics Warranty

Secure Packaging & Reliable Delivery

People-Powered Support

Product Overview

The Olympus MPLFLN-BD 20× Objective is a high-performance objective engineered for industrial microscopy applications requiring both detailed imaging and versatile contrast enhancement. As part of Olympus's Plan semi-apochromat series, this objective combines 20× magnification with dual brightfield/darkfield imaging capability, making it an essential tool for materials analysis, quality control, and failure analysis.

The brightfield/darkfield (BD) design allows you to switch between two complementary imaging modes without changing objectives. Brightfield mode provides standard reflected light imaging for general observation, while darkfield mode dramatically enhances contrast by illuminating the specimen at oblique angles — revealing surface defects, scratches, grain boundaries, and other features that would be invisible in brightfield alone.

At 20× magnification with a numerical aperture of 0.45, this objective delivers high resolution for detailed examination of industrial specimens. The MPLFLN optical design ensures flat-field imaging with minimal distortion from center to edge, while the plan semi-apochromat correction delivers excellent color fidelity and chromatic aberration control.

Technical Specifications

Magnification 20×
Numerical Aperture (NA) 0.45
Imaging Modes Brightfield / Darkfield (BD)
Optical Design MPLFLN (Plan Semi-Apochromat)
Working Distance 3 mm
Mount M26 Thread
Application Industrial Reflected Light Microscopy
SKU N5744300
Condition Excellent, flawless optics

Microscope Compatibility

Typical Applications

Metallurgical analysis and microstructure examination Semiconductor wafer and IC inspection
Semiconductor wafer and IC inspection
Surface defect detection and quality control
Failure analysis and forensic investigation
Materials science research and characteriz
  • Designed for Mixed-Brand Lab Environments

    Olympus, Nikon, Zeiss, Leica components in one place

  • Quality-Verified New & Pre-Owned Equipment

    Professionally sourced and verified for performance

  • Backed by Spach Optics Warranty & Support

    Ideal for labs using multiple microscope platforms

  • Fast, Reliable U.S. Shipping

    Most orders ship quickly from within the United States

  • Expert Support from Optical Specialists

    Guidance on compatibility, selection, and configuration