Olympus MPlanFL N 150x/0.90 Brightfield & Darkfield Long Working Distance Objective (NA 0.90, Infinity, M26)

The Olympus MPlanFL N 150×/0.90 Brightfield & Darkfield Long Working Distance Objective is a high-magnification reflected light objective from Olympus’s MPlanFL N BD series — delivering 150× magnification with dual brightfield and darkfield capability, semi-apochromat correction, and a 1mm working distance for detailed inspection of polished surfaces, scratches, etchings, and fine microstructural features. Offered here in excellent condition with flawless optics at significant savings versus the list price.

• 🔦 Dual brightfield & darkfield (BD) capability — a single objective supports both brightfield and darkfield reflected light imaging; darkfield is specifically optimized for high-contrast detection of scratches, etchings, grain boundaries, and surface defects that are difficult or impossible to see in brightfield
• 🔬 150× magnification, NA 0.90 — very high magnification for detailed examination of fine microstructural features, thin films, surface topography, and sub-micron defects
• 📏 Long working distance: 1mm — generous clearance at 150× for imaging large or mounted specimens; standard 150× objectives typically offer significantly less working distance
• 🌟 Semi-apochromat (MPlanFL N) correction — fluorite semi-apochromat correction for accurate color rendering and chromatic correction across the visible spectrum, essential for accurate documentation and color-based defect analysis
• ♾️ Infinity-corrected, M26 thread — compatible with Olympus BX, GX, MX, and BHM series industrial and materials microscopes
• 🇯🇵 Olympus quality, made in Japan — precision optical construction for consistent, high-efficiency light transmission and long service life
• ✅ Condition: Excellent — flawless optics — SKU MPLFLN150XBD

🔧 Product Description

The Olympus MPlanFL N 150×/0.90 BD is a specialized high-magnification reflected light objective engineered for the most demanding surface inspection applications in industrial and materials microscopy. The BD (Brightfield/Darkfield) designation indicates that this objective supports both illumination modes from a single objective — brightfield for standard surface imaging and darkfield for high-contrast detection of surface features that scatter light differently from the surrounding surface, including scratches, etchings, grain boundaries, particles, and thin film defects. Darkfield at 150× is particularly powerful for revealing fine surface topography and sub-micron defects that are invisible or poorly contrasted in brightfield. The semi-apochromat (MPlanFL N) correction provides accurate chromatic correction across the visible spectrum for reliable color-based defect analysis and documentation. The 1mm working distance is generous for a 150× objective, providing practical clearance for large wafers, mounted specimens, and components in fixtures. Compatible with Olympus BX, GX, MX, and BHM series industrial and materials microscopes with M26 thread nosepieces. This unit is offered in excellent condition with flawless optics at a significant discount to the list price of $4,800. SKU MPLFLN150XBD.

🔎 Typical Applications

• Darkfield inspection of scratches, etchings, and surface defects at 150×
• High-magnification metallographic examination of grain structure and microfeatures
• Semiconductor wafer and die inspection at very high magnification
• Thin film and coating defect analysis on polished substrates
• Sub-micron surface topography and defect detection using darkfield contrast
• Color-based defect analysis requiring semi-apochromat chromatic correction

📊 Key Specifications

University and institutional purchase orders are welcome. Please contact us for invoicing and procurement documentation.