Olympus MPlanFL N 150x/0.90 Brightfield & Darkfield Long Working Distance Objective (NA 0.90, Infinity, M26)
Regular price
$2,800.00
Sale price
$2,800.00
Regular price
$4,800.00
save $2,000.00
The Olympus MPlanFL N 150×/0.90 Brightfield & Darkfield Long Working Distance Objective is a high-magnification reflected light objective from Olympus’s MPlanFL N BD series — delivering 150× magnification with dual brightfield and darkfield capability, semi-apochromat correction, and a 1mm working distance for detailed inspection of polished surfaces, scratches, etchings, and fine microstructural features. Offered here in excellent condition with flawless optics at significant savings versus the list price.
KEY FEATURES
- Dual brightfield & darkfield (BD) capability — a single objective supports both brightfield and darkfield reflected light imaging; darkfield is specifically optimized for high-contrast detection of scratches, etchings, grain boundaries, and surface defects that are difficult or impossible to see in brightfield
- 150× magnification, NA 0.90 — very high magnification for detailed examination of fine microstructural features, thin films, surface topography, and sub-micron defects
- Long working distance: 1mm — generous clearance at 150× for imaging large or mounted specimens; standard 150× objectives typically offer significantly less working distance
- Semi-apochromat (MPlanFL N) correction — fluorite semi-apochromat correction for accurate color rendering and chromatic correction across the visible spectrum, essential for accurate documentation and color-based defect analysis
- Infinity-corrected, M26 thread — compatible with Olympus BX, GX, MX, and BHM series industrial and materials microscopes
- 🇯🇵 Olympus quality, made in Japan — precision optical construction for consistent, high-efficiency light transmission and long service life
- Condition: Excellent — flawless optics — SKU MPLFLN150XBD
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Technical Specifications
| SKU | MPLFLN150XBD |
| Magnification | 150× |
| Numerical Aperture (NA) | 0.90 |
| Immersion Medium | Dry (air, no coverslip) |
| Working Distance | 1mm (LWD) |
| Illumination / Contrast | Brightfield & Darkfield reflected light (BD) |
| Optical Design | MPlanFL N BD (Semi-apochromat, fluorite, BD) |
| Correction | Infinity-corrected |
| Thread / Mount | M26 |
| Compatible Microscopes | Olympus BX, GX, MX, BHM series industrial/materials microscopes |
| Country of Origin | Japan |
| Condition | Excellent — flawless optics |
Microscope Compatibility
Typical Applications
Darkfield inspection of scratches, etchings, and surface defects at 150×
High-magnification metallographic examination of grain structure and microfeatures
Semiconductor wafer and die inspection at very high magnification
Thin film and coating defect analysis on polished substrates
Sub-micron surface topography and defect detection using darkfield contrast
Color-based defect analysis requiring semi-apochromat chromatic correction
