Olympus MIRPLAN 100X Objective for IR Applications - Infinity Corrected

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SKU: 1-LM590i

Regular price $2,800.00
Sale price $2,800.00 Regular price $8,600.00 save $5,800.00
Olympus MIRPLAN 100X NA 0.95 IR/NIR Infinity Corrected Dry Objective — RMS Mount | Like New

KEY FEATURES

  • 100X magnification with NA 0.95 for near-theoretical dry objective resolution
  • IR/NIR corrected optics — optimized from visible through near-infrared wavelengths
  • Semi-Apochromat (MIRPlan) correction for superior chromatic and spherical aberration control
  • Infinity corrected design for compatibility with modern Olympus industrial microscope systems
  • RMS thread mount for broad system compatibility
  • Excellent like-new condition — fully inspected and optically verified
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Product Overview

The Olympus MIRPLAN 100X (NA 0.95) is a high-performance infinity-corrected dry objective engineered for infrared and near-infrared (NIR) imaging applications. Part of Olympus's MIRPlan Semi-Apochromat series, it delivers outstanding chromatic correction from visible through near-infrared wavelengths — ideal for IR microscopy, semiconductor inspection, and materials analysis. With NA 0.95, it achieves near-theoretical resolution limits for a dry objective. Compatible with Olympus BX, GX, MX, and BHM series industrial reflected light microscopes. Part No. 1-LM590i. Condition: Excellent — Like New.

Technical Specifications

Magnification 100X
Numerical Aperture (NA) 0.95
Correction Semi-Apochromat (MIRPlan)
Optical System Infinity Corrected
Spectral Range Visible to Near-Infrared (IR/NIR)
Working Distance ~0.1 mm (Contact)
Thread Mount RMS
Immersion Medium Dry
Part Number 1-LM590i
Country of Origin Japan

Microscope Compatibility

Olympus BX Series (BX40, BX50, BX51, BX60, BX61)
Olympus GX Series Industrial Inverted Microscopes
Olympus MX Series Semiconductor Inspection Microscopes
Olympus BHM Series Industrial Reflected Light Microscopes
Any RMS-threaded infinity-corrected reflected light microscope system

Typical Applications

Infrared (IR) and near-infrared (NIR) microscopy
Semiconductor wafer and IC inspection
Silicon and compound semiconductor analysis
Industrial reflected light microscopy (BX, GX, MX, BHM systems)
Materials science and failure analysis
Thin film and coating characterization
Photovoltaic (solar cell) inspection
  • Designed for Mixed-Brand Lab Environments

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    Professionally sourced and verified for performance

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    Ideal for labs using multiple microscope platforms

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