Olympus LMPLFLN-BD 20X Objective – Long Working Distance

In stock

SKU: N2183800

Regular price $3,595.00
Premium 20× long working distance objective with brightfield and darkfield capability — ideal for industrial inspection and materials science applications.

KEY FEATURES

  • 20× Magnification — Optimal balance of resolution and field of view for detailed surface inspection.
  • Brightfield/Darkfield (BD) Capability — Dual-mode imaging for enhanced contrast and defect detection on reflective surfaces.
  • Long Working Distance — 12mm. Extended clearance provides specimen safety and accommodates thicker samples or uneven surfaces.
  • LMPLFLN Plan Semi-Apochromat Design — Delivers flat-field imaging with excellent color correction across the visible spectrum.
  • Industrial Reflected Light Compatibility — Designed for Olympus BX, GX, MX, and BHM series industrial microscopes.
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Product Overview

The Olympus LMPLFLN 20× BD Objective is a high-performance, long working distance objective engineered for demanding industrial microscopy applications. As part of Olympus's Plan semi-apochromat series, this objective combines extended working distance with dual brightfield/darkfield imaging capability, making it an essential tool for materials analysis, quality control, and failure analysis in manufacturing and research environments.

The brightfield/darkfield (BD) design allows you to switch between two complementary imaging modes without changing objectives. Brightfield mode provides standard reflected light imaging for general observation, while darkfield mode dramatically enhances contrast by illuminating the specimen at oblique angles — revealing surface defects, scratches, grain boundaries, and other features that would be invisible in brightfield alone.

The long working distance is a critical advantage when inspecting industrial samples, providing generous clearance for thick specimens, rough surfaces, or samples that require manipulation during observation. This extended working distance also reduces the risk of objective damage from contact with the specimen, protecting your investment in precision optics.

The LMPLFLN optical design ensures flat-field imaging with minimal distortion from center to edge, while the plan semi-apochromat correction delivers excellent color fidelity and chromatic aberration control. This combination makes the objective well-suited for both visual inspection and digital documentation of industrial samples.

Compatible with Olympus industrial reflected light microscope systems including the BX, GX, MX, and BHM series, this objective integrates seamlessly into metallurgical, semiconductor, and materials science workflows.

Technical Specifications

Magnification 20×
Imaging Modes Brightfield / Darkfield (BD)
Optical Design LMPLFLN (Plan Semi-Apochromat)
Working Distance 12 mm
Application Industrial Reflected Light Microscopy
Compatibility Olympus BX, GX, MX, BHM series
SKU N2183800
Part Number 1-U2N345
Country of Origin Japan

Microscope Compatibility

Typical Applications

Metallurgical analysis and microstructure examination
Semiconductor wafer and IC inspection
Surface defect detection and quality control
Failure analysis and forensic investigation
Materials science research and characterization
Precision manufacturing inspection
  • Designed for Mixed-Brand Lab Environments

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    Ideal for labs using multiple microscope platforms

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