Olympus LMPLANFL 100x Objective

In stock

SKU: LMPLFL100X

Regular price $2,800.00
Sale price $2,800.00 Regular price $6,995.00 save $4,195.00
Olympus LMPLANFL 100X Objective

KEY FEATURES

  • Plan semi-apochromat optics — superior contrast and color correction for reflected light industrial microscopy
  • Long working distance: 3.4 mm — exceptional clearance at 100X for safe, non-contact inspection of topographic samples
  • 0.80 numerical aperture — high-resolution imaging with extended working distance
  • RMS thread — compatible with Olympus BX, GX, MX, and BHM series industrial microscopes
  • Condition: Excellent, Flawless Optics — inspected and ready for immediate use
  • University purchase orders accepted
Backed by Spach Optics Warranty

Secure Packaging & Reliable Delivery

People-Powered Support

Product Overview

The Olympus LMPLANFL 100X (1-UM354) is a long working distance plan semi-apochromat objective from Olympus's LMPLFL series, engineered for reflected light industrial microscopy on BX, GX, MX, and BHM series microscopes. With a remarkable 3.4 mm working distance at 100X magnification and a 0.80 NA, it delivers high-resolution imaging with generous clearance — protecting samples with significant surface topography from contact damage while maintaining excellent optical performance. The plan semi-apochromat design provides increased contrast and superior color correction compared to standard plan objectives, making it ideal for semiconductor inspection, metallurgy, and precision surface analysis where both resolution and specimen safety are critical. Excellent condition with flawless optics. Manufactured in Japan to Olympus's exacting standards.

Technical Specifications

Catalog Number 1-UM354
Magnification 100X
Numerical Aperture 0.80
Working Distance 3.4 mm
Thread RMS
Optical Design Plan Semi-Apochromat (LMPLFL)
Illumination Reflected Light Brightfield
Compatible Microscopes Olympus BX, GX, MX, BHM Series
Condition Excellent, Flawless Optics
Country of Origin Japan

Microscope Compatibility

Typical Applications

Semiconductor wafer and die inspection at high magnification
Metallurgical and materials science surface analysis
PCB and electronic component inspection
Precision surface topography and roughness analysis
Reflected light brightfield microscopy on industrial samples
  • Designed for Mixed-Brand Lab Environments

    Olympus, Nikon, Zeiss, Leica components in one place

  • Quality-Verified New & Pre-Owned Equipment

    Professionally sourced and verified for performance

  • Backed by Spach Optics Warranty & Support

    Ideal for labs using multiple microscope platforms

  • Fast, Reliable U.S. Shipping

    Most orders ship quickly from within the United States

  • Expert Support from Optical Specialists

    Guidance on compatibility, selection, and configuration