Olympus LCPLFLN20XLCD 20X Objective – LCD Long Working Distance
SKU: N2216000
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Specialized 20× semi-apochromatic objective optimized for LCD and glass substrate inspection — ideal for display panel analysis, semiconductor inspection through glass, and applications requiring observation through varying glass thicknesses.
- 🔬 20× Magnification, NA 0.45 — High numerical aperture for excellent resolution through glass substrates.
- 📏 Extra-Long Working Distance (7.4-8.3 mm) — Exceptional clearance for thick glass substrates and LCD panels.
- 🔧 Correction Collar — Adjustable optical correction for varying glass substrate thicknesses.
- ✨ Semi-Apochromatic Correction — Superior color correction and image quality across the visible spectrum.
- ♾️ Infinity Corrected — Modern optical design for compatibility with advanced microscopy techniques.
🔧 Product Description
The Olympus LCPLFLN20XLCD 20× Objective is a specialized semi-apochromatic lens engineered specifically for observation through glass substrates such as LCD panels, display screens, and semiconductor devices with protective glass layers. This unique objective combines high numerical aperture, extra-long working distance, and adjustable optical correction to deliver exceptional image quality when observing samples through varying thicknesses of glass.
LCD and display panel inspection presents unique optical challenges. When observing through glass substrates, spherical aberration degrades image quality and resolution. The LCPLFLN series solves this problem with an adjustable correction collar that compensates for varying glass thickness. By adjusting the collar to match your substrate thickness, you restore optimal optical performance and achieve sharp, high-contrast images through the glass.
At 20× magnification with a 0.45 numerical aperture, this objective delivers excellent resolution for detailed observation of LCD pixels, TFT structures, defects, and other features. The high NA provides excellent light-gathering capability and resolution even when working through glass substrates, revealing details that would be lost with standard objectives. The 20× magnification strikes an ideal balance between detail and field of view for efficient display panel survey and inspection.
The extra-long working distance of 7.4-8.3 mm (depending on correction collar setting) provides exceptional clearance for thick glass substrates and LCD panels. This extended working distance allows you to observe samples through substantial protective glass layers while maintaining generous space between the objective and the glass surface, virtually eliminating the risk of contact damage to both the objective and the sample.
The semi-apochromatic optical design delivers superior color correction across the visible spectrum, ensuring accurate color rendition and high-contrast imaging essential for LCD color filter inspection, display quality analysis, and photomicrography. The plan fluorite construction provides flat-field imaging with minimal curvature of field, maintaining sharp focus from the center to the edge of the field of view — critical for large-area display panel inspection and image stitching.
As an infinity-corrected objective, this lens is designed for modern microscope systems where the image is formed at infinity, allowing the insertion of optical components such as filters, polarizers, or DIC prisms in the parallel light path without introducing aberrations. This makes it compatible with advanced contrast techniques and modular microscopy accessories.
Featuring a standard RMS thread mount, this objective is compatible with most upright research microscope systems, including Olympus BX, GX, MX, and BHM series microscopes. The robust construction and precision Japanese manufacturing ensure reliable performance in demanding production and research environments where LCD and display inspection is critical.
🔎 Typical Applications
- LCD panel and display screen inspection
- TFT structure and pixel defect analysis
- Observation through thick glass substrates and protective layers
- Semiconductor device inspection through glass
- Display quality control and failure analysis
- Color filter and optical component inspection
📊 Key Specifications
Specification |
Details |
Magnification |
20× |
Numerical Aperture (NA) |
0.45 |
Working Distance |
7.4-8.3 mm (Extra-Long, varies with correction) |
Correction Collar |
Adjustable (Glass Substrate Thickness Compensation) |
Optical Design |
LCPLFLN (LCD Plan Fluorite, Long WD) |
Field Flatness |
Plan (Flat-field) |
Color Correction |
Semi-Apochromatic |
Optical System |
Infinity Corrected |
Thread Mount |
RMS (20.32 x 36 TPI) |
Application |
LCD/Display Inspection, Glass Substrate Observation |
Compatibility |
Olympus BX, GX, MX, BHM series microscopes |
SKU |
N2216000 |
Condition |
New / Open Box |
💼 University Purchase Orders Accepted
Thank you for viewing! Please contact us with any questions about this objective or your specific industrial microscopy requirements.
