Olympus LCPLFLN100XLCD 100X Objective – LCD Long Working Distance

In stock

SKU: N2216100

Regular price $9,995.00
Sale price $9,995.00 Regular price $12,000.00 save $2,005.00
Specialized 100× semi-apochromatic objective optimized for LCD and glass substrate inspection — ideal for maximum magnification display panel analysis, semiconductor inspection through glass, and applications requiring observation through varying glass thicknesses.

KEY FEATURES

  • 100× Magnification, NA 0.85 — Ultra-high numerical aperture for exceptional resolution through glass substrates.
  • Long Working Distance (0.9-1.2 mm) — Good clearance for glass substrates and LCD panels at high magnification.
  • Correction Collar (0-0.7 mm) — Adjustable optical correction for varying glass substrate thicknesses.
  • Semi-Apochromatic Correction — Superior color correction and image quality across the visible spectrum.
  • Infinity Corrected — Modern optical design for compatibility with advanced microscopy techniques.
Backed by Spach Optics Warranty

Secure Packaging & Reliable Delivery

People-Powered Support

Product Overview

The Olympus LCPLFLN100XLCD 100× Objective is a specialized semi-apochromatic lens engineered specifically for observation through glass substrates such as LCD panels, display screens, and semiconductor devices with protective glass layers at maximum magnification. This unique objective combines ultra-high numerical aperture, long working distance, and adjustable optical correction to deliver exceptional image quality when observing samples through varying thicknesses of glass at 100× magnification.

LCD and display panel inspection at high magnification presents unique optical challenges. When observing through glass substrates, spherical aberration degrades image quality and resolution. The LCPLFLN series solves this problem with an adjustable correction collar that compensates for glass thickness from 0 to 0.7 mm. By adjusting the collar to match your substrate thickness, you restore optimal optical performance and achieve sharp, high-contrast images through the glass at maximum magnification.

At 100× magnification with a 0.85 numerical aperture, this objective delivers ultra-high resolution for detailed observation of LCD pixels, TFT structures, defects, and other ultra-fine features. The high NA provides exceptional light-gathering capability and resolution even when working through glass substrates, revealing submicron details that would be lost with standard objectives. This makes it ideal for failure analysis and defect characterization at the highest magnification.

The long working distance of 0.9-1.2 mm (depending on correction collar setting) provides good clearance for glass substrates and LCD panels at 100× magnification. This working distance allows you to observe samples through protective glass layers while maintaining adequate space between the objective and the glass surface, reducing the risk of contact damage to both the objective and the sample.

The semi-apochromatic optical design delivers superior color correction across the visible spectrum, ensuring accurate color rendition and high-contrast imaging essential for LCD color filter inspection, display quality analysis, and photomicrography at maximum magnification. The plan fluorite construction provides flat-field imaging with minimal curvature of field, maintaining sharp focus from the center to the edge of the field of view.

As an infinity-corrected objective, this lens is designed for modern microscope systems where the image is formed at infinity, allowing the insertion of optical components such as filters, polarizers, or DIC prisms in the parallel light path without introducing aberrations. This makes it compatible with advanced contrast techniques and modular microscopy accessories.

Featuring a standard RMS thread mount, this objective is compatible with most upright research microscope systems, including Olympus BX, GX, MX, and BHM series microscopes. The robust construction and precision Japanese manufacturing ensure reliable performance in demanding production and research environments where LCD and display inspection at maximum magnification is critical.

Technical Specifications

Magnification 100×
Numerical Aperture (NA) 0.85 (Ultra-High)
Working Distance 0.9-1.2 mm (Long, varies with correction)
Correction Collar Range 0-0.7 mm (Glass Substrate Thickness)
Optical Design LCPLFLN (LCD Plan Fluorite, Long WD)
Field Flatness Plan (Flat-field)
Color Correction Semi-Apochromatic
Optical System Infinity Corrected
Thread Mount RMS (20.32 x 36 TPI)
Application LCD/Display Inspection, Glass Substrate Observation
Compatibility Olympus BX, GX, MX, BHM series microscopes
Country of Origin Japan
SKU N2216100
Condition New

Microscope Compatibility

Typical Applications

Maximum magnification LCD panel and display screen inspection
TFT structure and pixel defect analysis at high magnification
Observation through glass substrates and protective layers
Semiconductor device inspection through glass at 100×
Display failure analysis and quality control
Submicron feature observation through glass
  • Designed for Mixed-Brand Lab Environments

    Olympus, Nikon, Zeiss, Leica components in one place

  • Quality-Verified New & Pre-Owned Equipment

    Professionally sourced and verified for performance

  • Backed by Spach Optics Warranty & Support

    Ideal for labs using multiple microscope platforms

  • Fast, Reliable U.S. Shipping

    Most orders ship quickly from within the United States

  • Expert Support from Optical Specialists

    Guidance on compatibility, selection, and configuration