Olympus LCPLFLN100XLCD 100X Objective – LCD Long Working Distance
Regular price
$9,995.00
Sale price
$9,995.00
Regular price
$12,000.00
save $2,005.00
Specialized 100× semi-apochromatic objective optimized for LCD and glass substrate inspection — ideal for maximum magnification display panel analysis, semiconductor inspection through glass, and applications requiring observation through varying glass thicknesses.
KEY FEATURES
- 100× Magnification, NA 0.85 — Ultra-high numerical aperture for exceptional resolution through glass substrates.
- Long Working Distance (0.9-1.2 mm) — Good clearance for glass substrates and LCD panels at high magnification.
- Correction Collar (0-0.7 mm) — Adjustable optical correction for varying glass substrate thicknesses.
- Semi-Apochromatic Correction — Superior color correction and image quality across the visible spectrum.
- Infinity Corrected — Modern optical design for compatibility with advanced microscopy techniques.
Backed by Spach Optics Warranty
Secure Packaging & Reliable Delivery
People-Powered Support
Technical Specifications
| Magnification | 100× |
| Numerical Aperture (NA) | 0.85 (Ultra-High) |
| Working Distance | 0.9-1.2 mm (Long, varies with correction) |
| Correction Collar Range | 0-0.7 mm (Glass Substrate Thickness) |
| Optical Design | LCPLFLN (LCD Plan Fluorite, Long WD) |
| Field Flatness | Plan (Flat-field) |
| Color Correction | Semi-Apochromatic |
| Optical System | Infinity Corrected |
| Thread Mount | RMS (20.32 x 36 TPI) |
| Application | LCD/Display Inspection, Glass Substrate Observation |
| Compatibility | Olympus BX, GX, MX, BHM series microscopes |
| Country of Origin | Japan |
| SKU | N2216100 |
| Condition | New |
Microscope Compatibility
Typical Applications
Maximum magnification LCD panel and display screen inspection
TFT structure and pixel defect analysis at high magnification
Observation through glass substrates and protective layers
Semiconductor device inspection through glass at 100×
Display failure analysis and quality control
Submicron feature observation through glass
