Olympus IX Inverted Reflected Light Industrial Microscope - DIC, BF, Pol

In stock

SKU: IX-Metallurgical-DIC

Regular price $12,500.00
Sale price $12,500.00 Regular price $36,200.00 save $23,700.00
The Olympus IX Inverted Metallurgical Microscope is a fully configured, reconditioned industrial reflected light system equipped with a complete set of UMPlanFL objectives, DIC/Nomarski contrast, polarized light, and a 1x C-mount camera port — a turnkey solution for materials characterization, failure analysis, and semiconductor inspection.

KEY FEATURES

  • 5-objective UMPlanFL set — 5x, 10x, 20x, 50x, and 100x infinity-corrected reflected light objectives
  • DIC/Nomarski contrast — U-DICR Nomarski slider for high-contrast surface topography imaging
  • Polarized light — polarized light filter cube for grain structure, stress, and anisotropy analysis
  • Camera ready — trinocular port with 1x C-mount adapter for digital documentation
  • Left-hand mechanical XY stage — precise specimen positioning for large sample navigation
  • Reconditioned / excellent condition — professionally serviced and verified
  • Custom configurations available — contact us to modify the setup for your application
  • University purchase orders accepted
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Product Overview

The Olympus IX inverted metallurgical microscope is a high-performance reflected light platform designed for industrial materials science, semiconductor inspection, and failure analysis applications. The inverted configuration places the objectives below the stage, allowing large, heavy, or irregularly shaped specimens — such as wafers, metal billets, and mounted cross-sections — to be placed flat on the stage without height constraints. This system is equipped with a full complement of five UMPlanFL infinity-corrected objectives spanning 5x through 100x, covering the complete magnification range needed for macro survey through high-resolution surface detail. The U-DICR Nomarski DIC slider adds differential interference contrast capability, revealing surface topography, grain boundaries, and thin film features with exceptional three-dimensional contrast. The polarized light filter cube enables grain structure analysis, stress birefringence imaging, and identification of anisotropic materials. A 4-position filter turret with brightfield cube, vertical illuminator with iris, 12V/100W lamphouse and power supply, left-hand mechanical XY stage, 10x widefield eyepieces, and 1x C-mount camera port complete this turnkey system. Custom configurations are available upon request.

Technical Specifications

Manufacturer Olympus
Platform IX Inverted Metallurgical Microscope
Objectives Included UMPlanFL 5x/0.15 NA (WD 20mm), 10x/0.30 NA (WD 10.1mm), 20x/0.46 NA (WD 3.1mm), 50x/0.80 NA (WD 0.66mm), 100x/0.95 NA (WD 0.31mm)
DIC / Nomarski U-DICR Nomarski Slider
Polarized Light Polarized Light Filter Cube
Filter Turret 4-position with Brightfield Cube installed
Illumination Vertical Illuminator with Iris, 12V/100W Lamphouse & Power Supply
Stage Left-hand Mechanical XY Stage
Eyepieces 10x Widefield
Camera Port 1x C-mount
Focus Coarse and Fine Adjustment
Country of Origin Japan
Condition Reconditioned / Excellent

Microscope Compatibility

Typical Applications

Metallographic analysis of grain structure, inclusions, and phase distribution
Semiconductor wafer and device inspection using reflected brightfield and DIC
Failure analysis and surface defect characterization on metals and alloys
Thin film and coating inspection with DIC/Nomarski contrast
Polarized light analysis of anisotropic materials, stress birefringence, and crystal structure
  • Designed for Mixed-Brand Lab Environments

    Olympus, Nikon, Zeiss, Leica components in one place

  • Quality-Verified New & Pre-Owned Equipment

    Professionally sourced and verified for performance

  • Backed by Spach Optics Warranty & Support

    Ideal for labs using multiple microscope platforms

  • Fast, Reliable U.S. Shipping

    Most orders ship quickly from within the United States

  • Expert Support from Optical Specialists

    Guidance on compatibility, selection, and configuration