Olympus DPMC-ANIR Analyzer for WI-DPMC for 900NM IR
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$1,350.00
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$1,350.00
Regular price
$2,635.00
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Olympus DPMC-ANIR Analyzer — For WI-DPMC, 900 nm Infrared Infrared analyzer for the WI-DPMC DIC system, optimized for 900 nm IR wavelength — ideal for near-infrared DIC microscopy of silicon wafers, semiconductor devices, and IR-transparent materials.
KEY FEATURES
- Infrared Analyzer — optimized for 900 nm near-infrared wavelength DIC microscopy
- WI-DPMC Compatible — designed specifically for the Olympus WI-DPMC DIC system
- IR Transmission Microscopy — enables DIC imaging through silicon and other IR-transparent materials
- Compatible with Olympus WI-DPMC DIC system
- New condition
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Technical Specifications
| Type | Infrared Analyzer for DIC |
| Optimized Wavelength | 900 nm (near-infrared) |
| System Compatibility | Olympus WI-DPMC DIC system |
| SKU | DPMC-ANIR |
| Condition | New |
| Country of Origin | Japan |
Microscope Compatibility
Typical Applications
Silicon wafer and semiconductor device inspection via IR transmission
Near-infrared DIC microscopy of IR-transparent materials
Semiconductor failure analysis and defect inspection
IR transmission imaging of integrated circuits
Research-grade near-infrared polarization microscopy
