Olympus BX60 Brightfield Darkfield Reflected Light DIC Microscope
Regular price
$12,000.00
Sale price
$12,000.00
Regular price
$26,500.00
save $14,500.00
The Olympus BX60M Reflected Light Brightfield, Darkfield & DIC Microscope is a fully configured, research-grade reflected light system built for demanding materials science, metallurgy, semiconductor inspection, and surface analysis applications — combining brightfield, darkfield, DIC/Nomarski, and polarized light in a single, versatile platform.
KEY FEATURES
- Five UM Plan FL BD objectives: 5x, 10x, 20x, 50x, and 100x — flat-field, high-contrast optics optimized for reflected light across the full magnification range
- Brightfield and darkfield reflected light illuminator with 12V 100W quartz halogen lamphouse for versatile contrast switching
- DIC/Nomarski system: U-DICR Nomarski prism slider, U-AN360 360° rotatable analyzer, and U-PO polarizer for high-contrast surface topography imaging
- 3-position trinocular head for simultaneous observation and camera documentation
- Right-hand mechanical XY stage with stage finger for precise, repeatable specimen navigation
- Condition: Excellent — includes instruction manual, extra bulbs, and dust cover
Backed by Spach Optics Warranty
Secure Packaging & Reliable Delivery
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Technical Specifications
| Frame | Olympus BX60M reflected light |
| Head | 3-position trinocular |
| Eyepieces | 10x Widefield |
| Nosepiece | 5-place BD |
| Objectives | UM Plan FL 5x BD, 10x BD, 20x BD, 50x BD, 100x BD |
| Illuminator | Brightfield/Darkfield reflected light, 12V 100W quartz halogen |
| DIC System | U-DICR Nomarski prism slider, U-AN360 360° rotatable analyzer, U-PO polarizer |
| Stage | Right-hand mechanical XY with stage finger |
| Accessories Included | Instruction manual, extra bulbs, dust cover |
| Condition | Excellent |
| SKU | BX60M-DIC |
| Country of Origin | Japan |
| Weight | 35 lbs |
Microscope Compatibility
Typical Applications
Metallurgical analysis and grain structure examination
Semiconductor wafer and microelectronics inspection
Thin film and coating surface characterization
Surface defect detection and quality control
Reflected light DIC for surface topography and relief imaging
Darkfield inspection of scratches, particles, and surface anomalies
