Olympus BX51 Reflected Light DIC Microscope with LWD Objectives and Transmitted Light
Regular price
$17,500.00
Sale price
$17,500.00
Regular price
$39,500.00
save $22,000.00
The Olympus BX51TRF Reflected & Transmitted Light Brightfield, Darkfield & DIC Microscope with Long Working Distance Objectives is a fully configured, research-grade dual-mode system built for demanding materials science, semiconductor inspection, and surface analysis — combining brightfield, darkfield, and DIC/Nomarski reflected light with long working distance objectives for large or thick specimen accommodation.
KEY FEATURES
- Five BD objectives: UMPlanFL 5x, 10x and LMPlanFL 20x (WD 12mm), 50x (WD 10.6mm), 100x (WD 3.3mm) — exceptional working distances for large and uneven specimens
- Brightfield and darkfield reflected light illuminator with dual 12V 100W quartz halogen lamphouses (transmitted + reflected)
- Reflected light DIC system: U-DICR Nomarski prism slider, U-AN analyzer, and U-PO3 polarizer slider with locking plate
- 3-position trinocular head for simultaneous observation and camera documentation
- Right-hand mechanical XY stage with stage finger for precise, repeatable specimen navigation
- Complete system — includes instruction manual, extra bulbs, and dust cover
Backed by Spach Optics Warranty
Secure Packaging & Reliable Delivery
People-Powered Support
Technical Specifications
| Frame | Olympus BX51TRF (reflected & transmitted light) |
| Illumination | 2x 12V 100W quartz halogen lamphouses (transmitted + reflected) |
| Head | 3-position trinocular |
| Eyepieces | 10x Widefield |
| Nosepiece | 5-place BD |
| Objectives | UMPlanFL 5x BD, UMPlanFL 10x BD, LMPlanFL 20x BD (WD 12mm), LMPlanFL 50x BD (WD 10.6mm), LMPlanFL 100x BD (WD 3.3mm) |
| Reflected Light Illuminator | Brightfield/Darkfield |
| DIC System | U-DICR Nomarski prism slider, U-AN analyzer, U-PO3 polarizer slider with locking plate |
| Stage | Right-hand mechanical XY with stage finger |
| Accessories Included | Instruction manual, extra bulbs, dust cover |
| SKU | BX51-BF-DF-DIC |
| Country of Origin | Japan |
| Weight | 65 lbs |
Microscope Compatibility
Typical Applications
Semiconductor wafer and microelectronics inspection with LWD objectives
Metallurgical analysis of large or thick polished specimens
Reflected light DIC for surface topography and relief imaging
Darkfield inspection of surface defects, scratches, and particles
Thin film, coating, and materials surface characterization
Quality control and failure analysis in industrial settings
