Olympus BX41 Brightfield Darkfield DIC/Nomarski Reflected and Transmitted Light Microscope
Regular price
$14,500.00
Sale price
$14,500.00
Regular price
$28,500.00
save $14,000.00
The Olympus BX41 Brightfield, Darkfield & DIC/Nomarski Reflected and Transmitted Light Microscope is a fully configured, research-grade dual-mode system combining reflected light brightfield, darkfield, and DIC/Nomarski with transmitted light — featuring a complete five-objective UM Plan FL BD set and a trinocular head with C-mount for versatile materials science, industrial inspection, and biological research applications.
KEY FEATURES
- Five UM Plan FL BD objectives: 5x, 10x, 20x, 50x, and 100x — flat-field, high-contrast optics optimized for both reflected and transmitted light
- Brightfield and darkfield reflected light illuminator with 12V 100W quartz halogen lamphouse and TH-4 power supply
- Reflected light DIC system: U-DICR Nomarski prism slider, U-AN analyzer, and U-PO3 polarizer slider with locking plate
- Transmitted light: 6V 30W quartz halogen lamp socket with U-AC2 Abbe condenser
- 3-position trinocular head with C-mount: 100% eyes / 100% camera / simultaneous — for maximum imaging flexibility
- Condition: Refurbished — inspected and performance-verified
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Technical Specifications
| Frame | Olympus BX41 with transmitted light |
| Head | 3-position trinocular with C-mount (100% eyes / 100% camera / simultaneous) |
| Eyepieces | 10x Widefield |
| Nosepiece | 5-place BD |
| Objectives | UM Plan FL BD 5x, 10x, 20x, 50x, 100x |
| Reflected Illuminator | Brightfield/Darkfield, 12V 100W quartz halogen with TH-4 power supply |
| DIC System | U-DICR Nomarski prism slider, U-AN analyzer, U-PO3 polarizer with locking plate |
| Transmitted Illumination | 6V 30W quartz halogen lamp socket |
| Condenser | U-AC2 Abbe type |
| Stage | Right-hand mechanical XY with stage finger |
| Condition | Refurbished |
| SKU | BX41-DIC-TR |
| Country of Origin | Japan |
| Weight | 55 lbs |
Microscope Compatibility
Typical Applications
Metallurgical analysis and grain structure examination
Semiconductor wafer and microelectronics inspection
Reflected light DIC for surface topography and relief imaging
Darkfield inspection of surface defects, scratches, and particles
Thin film and coating surface characterization
Transmitted light brightfield for biological specimens and thin sections
