Olympus BHT Brightfield Darkfield Reflected Light DIC microscope
Regular price
$7,995.00
Sale price
$7,995.00
Regular price
$15,850.00
save $7,855.00
The Olympus BHT Reflected & Transmitted Light Brightfield, Darkfield & DIC Microscope is a fully configured, research-grade dual-mode system combining reflected light brightfield, darkfield, and DIC/Nomarski with transmitted light — featuring four Neo SPlan objectives with integrated DIC prisms, a large 4” × 4” XY travel stage, and a trinocular head for versatile materials science and industrial inspection applications.
KEY FEATURES
- Four Neo SPlan objectives with integrated DIC prisms: 10x, 20x, 50x, and 100x — each with a matched Nomarski prism for immediate DIC imaging at any magnification
- BD vertical illuminator with 12V 100W quartz halogen for brightfield and darkfield reflected light
- DIC/Nomarski system: integrated objective prisms, 360° rotatable polarizer, and analyzer for high-contrast surface topography imaging
- Large 4” × 4” XY travel stage for accommodating large specimens, wafers, and substrates
- 3-position trinocular head for simultaneous observation and camera documentation
- Condition: Refurbished, Excellent — inspected and performance-verified
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Technical Specifications
| Frame | Olympus BHT (reflected & transmitted light) |
| Head | 3-position trinocular |
| Objectives | Neo SPlan 10x (DIC), Neo SPlan 20x (DIC), Neo SPlan 50x (DIC), Neo SPlan 100x (DIC) |
| Reflected Illuminator | BD vertical illuminator, 12V 100W quartz halogen (brightfield/darkfield) |
| DIC System | Integrated objective prisms, 360° rotatable polarizer, analyzer |
| Transmitted Illumination | Quartz halogen transmitted light |
| Stage | 4” × 4” XY travel stage |
| Condition | Refurbished, Excellent |
| SKU | BHT-DIC |
| Country of Origin | Japan |
| Weight | 50 lbs |
Microscope Compatibility
Typical Applications
Metallurgical analysis and grain structure examination
Semiconductor wafer and large substrate inspection
Reflected light DIC for surface topography and relief imaging
Darkfield inspection of surface defects, scratches, and particles
Thin film and coating surface characterization
Quality control and failure analysis in industrial settings
