Olympus Berek Compensator for BH2 series

Out of stock

SKU: BH2-CTB

Regular price $995.00
Sale price $995.00 Regular price $1,995.00 save $1,000.00
Olympus Berek Compensator for BH2 Series Polarized Light Microscopes Berek compensator for quantitative retardation measurement on Olympus BH2 series polarized light microscopes — ideal for materials science, geological analysis, and advanced birefringence characterization requiring accurate optical path difference measurement.

KEY FEATURES

  • Quantitative Retardation Measurement — measures optical path difference of birefringent specimens with high precision
  • Berek Compensator Design — tilting calcite plate for variable, calibrated retardation measurement
  • Designed for Olympus BH2 series polarized light microscopes
  • Excellent condition
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Product Overview

The Olympus Berek Compensator for the BH2 series is a precision optical accessory for quantitative retardation measurement in polarized light microscopy. The Berek compensator uses a tilting calcite plate to introduce a variable, calibrated retardation into the optical path, allowing precise measurement of the optical path difference (OPD) of birefringent specimens. By tilting the calcite plate to the extinction position, the retardation of the specimen can be calculated from the tilt angle using calibration tables, providing quantitative birefringence data for mineral identification, materials characterization, and quality control. Designed specifically for the BH2 series, it ensures proper mechanical fit and optical alignment with BH2 polarized light microscope configurations.

Technical Specifications

Type Berek Compensator
Function Quantitative optical path difference measurement
Compatibility Olympus BH2 series polarized light microscopes
SKU OLYMPUS-BH2-CTB
Condition Excellent
Country of Origin Japan

Microscope Compatibility

Typical Applications

Quantitative birefringence and retardation measurement
Mineral identification and optical crystallography
Polymer and liquid crystal characterization
Stress and strain analysis in optical materials
Advanced geological thin section analysis on BH2 systems
  • Designed for Mixed-Brand Lab Environments

    Olympus, Nikon, Zeiss, Leica components in one place

  • Quality-Verified New & Pre-Owned Equipment

    Professionally sourced and verified for performance

  • Backed by Spach Optics Warranty & Support

    Ideal for labs using multiple microscope platforms

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    Most orders ship quickly from within the United States

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    Guidance on compatibility, selection, and configuration