Olympus 32IR900 900NM and above Band Pass Filter
Olympus 32IR900 900NM and above Band Pass Filter

Olympus 32IR900 900NM and Above Band Pass Filter

In stock

SKU: 9-U759

$895.00
$895.00 $1,195.00 save $300.00
The Olympus 32IR900 is a genuine OEM 32mm round infrared longpass filter that transmits 900nm and above, designed for near-infrared microscopy, semiconductor inspection, and IR imaging applications on Olympus microscope systems.

KEY FEATURES

  • IR longpass filter, 900nm and above — blocks visible light and transmits only near-infrared wavelengths (≥900nm)
  • 32mm round format — fits standard Olympus 32mm filter positions, holders, and filter wheels
  • Near-IR imaging optimized — ideal for silicon wafer inspection, IR-sensitive camera imaging, and NIR contrast applications
  • Genuine Olympus OEM — catalog no. 9-U759, new / open box
  • University purchase orders accepted
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Product Overview

The Olympus 32IR900 is a 32mm round infrared longpass filter with a 900nm transmission cutoff, blocking all visible light and passing only near-infrared wavelengths at 900nm and above. This filter is essential for applications where visible light must be excluded from the imaging path — such as silicon wafer and semiconductor device inspection (silicon is transparent to NIR), IR-sensitive camera imaging, and near-infrared contrast microscopy. When paired with an IR-sensitive camera or detector, the 32IR900 enables imaging of structures and features that are invisible under visible light illumination. The 32mm round format integrates directly into compatible Olympus filter holders, filter wheels (such as the U-FWR), and filter slider positions. Supplied as a genuine Olympus OEM component (catalog no. 9-U759) in new condition.

Technical Specifications

Manufacturer Olympus
Model 32IR900
Catalog Number 9-U759
Filter Type IR Longpass
Transmission Range 900 nm and above
Diameter 32 mm round
Condition New

Microscope Compatibility

Typical Applications

Silicon wafer and semiconductor device inspection using near-IR transmitted light
NIR contrast microscopy with IR-sensitive cameras or detectors
Blocking visible light in reflected and transmitted IR imaging workflows
Materials characterization requiring isolation of IR wavelengths (≥900nm)
Replacement of worn or missing IR longpass filters in Olympus filter positions

  • Designed for Mixed-Brand Lab Environments

    Olympus, Nikon, Zeiss, Leica components in one place

  • Quality-Verified New & Pre-Owned Equipment

    Professionally sourced and verified for performance

  • Backed by Spach Optics Warranty & Support

    Ideal for labs using multiple microscope platforms

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  • Expert Support from Optical Specialists

    Guidance on compatibility, selection, and configuration