Nikon L Plan 2.5x Reflected Light Objective
Regular price
$1,100.00
Sale price
$1,100.00
Regular price
$2,895.00
save $1,795.00
The Nikon L Plan EPI 2.5x Reflected Light Objective (cat. no. MUE00031) is a low-magnification, wide-field overview objective designed for reflected-light (EPI) microscopy on Nikon infinity-corrected systems. With a 2.5x magnification, N.A. 0.075, and 8.8mm working distance, it delivers a broad field of view ideal for specimen orientation, large-area survey imaging, and macro-level surface inspection before stepping up to higher magnifications. This unit is in excellent, as-new condition, available at significant savings over new pricing.
KEY FEATURES
- 2.5x magnification — wide-field overview for large specimens and macro-level surface survey
- 8.8mm working distance with N.A. 0.075 for comfortable low-magnification imaging
- EPI (reflected light) design for opaque and surface-level specimen inspection
- M25 thread, infinity-corrected — compatible with all Nikon infinity-corrected microscopes
- BD nosepiece compatible — adapter available (contact us) for use on Nikon BD nosepieces
- Excellent, as-new condition, inspected and verified
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Technical Specifications
| Manufacturer | Nikon |
| Model / Part Number | L Plan EPI 2.5x / MUE00031 |
| Magnification | 2.5x |
| Numerical Aperture (N.A.) | 0.075 |
| Working Distance (W.D.) | 8.8mm |
| Thread | M25 |
| Optical System | Infinity-Corrected |
| Illumination Type | EPI (Reflected Light) |
| Optical Correction | L Plan |
| BD Nosepiece Compatibility | Yes — adapter available (contact us) |
| Immersion Medium | Dry (Air) |
| Condition | Excellent — As New |
| Country of Origin | Japan |
Microscope Compatibility
Typical Applications
Large-area surface survey and specimen orientation at low magnification
Semiconductor wafer and panel macro-level inspection
PCB and large component overview imaging
Locating regions of interest before switching to higher magnification objectives
Metallurgical and materials surface overview
Industrial quality control on large or complex parts
