Nikon CFI S Plan FL LWD 20X Microscope Objective
Regular price
$11,500.00
Nikon CFI Super Plan Fluor High NA LWD 20X Microscope Objective with Correction Collar
KEY FEATURES
- Premium plan fluorite long working distance objective for demanding research applications
- 20X magnification with high 0.7 numerical aperture for exceptional resolution
- Superior fluorite optics deliver enhanced chromatic correction for fluorescence imaging
- Extra-long adjustable working distance: 2.3mm to 1.3mm via correction collar
- Integrated correction collar compensates for coverglass thickness variations
- M25 thread compatible with all Nikon CFI60 infinity-corrected microscope systems
- Brand new condition with full factory specifications
Backed by Spach Optics Warranty
Secure Packaging & Reliable Delivery
People-Powered Support
Technical Specifications
| Model / Catalog Number | CFI S Plan Fluor High NA LWD 20X / MRH08250 |
| Magnification | 20X |
| Numerical Aperture (NA) | 0.7 (high NA for long working distance class) |
| Optical Design | Super Plan Fluorite, Infinity-Corrected (CFI60) |
| Immersion Type | Dry (air) |
| Working Distance | 1.3mm to 2.3mm (adjustable via correction collar) |
| Correction Collar Range | Adjustable for coverglass thickness and optical path variations |
| Chromatic Correction | Fluorite (semi-apochromat, enhanced correction) |
| Field Flatness | Super Plan (exceptional flat field across entire image) |
| Thread Type | M25 (25mm metric thread) |
| Compatibility | All Nikon CFI60 infinity-corrected microscopes (Eclipse, Ti2, Ni-E series) |
| Recommended Applications | Live cell imaging, fluorescence, culture vessels, micromanipulation |
| Condition | New |
Microscope Compatibility
Typical Applications
Live cell imaging in culture vessels and microplates
Multi-channel fluorescence microscopy with extended working distance
Organoid and spheroid imaging in thick culture systems
Micromanipulation and microinjection procedures
Imaging through plastic culture vessels and non-standard chambers
Electrophysiology and patch-clamp microscopy
High-content screening and automated imaging
Thick specimen imaging requiring high NA and long WD
Confocal microscopy with extended working distance
