Nikon CF Plan EPI 100x SLWD Objective
Regular price
$1,200.00
Sale price
$1,200.00
Regular price
$5,995.00
save $4,795.00
High-magnification 100× industrial objective with super-long 4.7mm working distance for reflected light microscopy of opaque materials.
KEY FEATURES
- 100× Magnification, 0.73 NA — High-resolution imaging with excellent resolving power for detailed surface inspection and analysis.
- 4.7mm Super-Long Working Distance — Extended clearance protects objective lens and accommodates varied surface topographies.
- CF Plan Epi Design — Flat-field correction with optimized contrast for reflected light microscopy of opaque materials.
- ∞ Infinity-Corrected Optics — CF (Crystal Focus) design ensures compatibility with Nikon infinity-corrected microscope systems.
- Perfect Optics — Flawless optical performance; minor cosmetic wear on exterior housing does not affect imaging quality.
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Technical Specifications
| Catalog Number | MUL04900 |
| Magnification | 100× |
| Numerical Aperture (NA) | 0.73 |
| Working Distance | 4.7mm (Super-Long) |
| Optical Design | CF Plan Epi SLWD (Crystal Focus Plan, Epi, Super-Long Working Distance) |
| Illumination Mode | Epi (reflected light) |
| Correction | Infinity-corrected |
| Field Correction | Plan (flat-field) |
| Thread Type | RMS (Royal Microscopical Society) |
| Compatibility | Nikon infinity-corrected microscopes |
| Application | Reflected light microscopy of opaque materials |
| Condition | Perfect optics; minor cosmetic wear on exterior housing |
Microscope Compatibility
Typical Applications
Metallographic analysis and grain structure examination
Semiconductor wafer and die inspection
Surface defect detection and characterization
Failure analysis and quality control
Coating and thin film inspection
Precision machined surface evaluation
Materials science research
Forensic materials examination
