Nikon CF Plan 2.5x Reflected Light Objective
Regular price
$795.00
Sale price
$795.00
Regular price
$1,595.00
save $800.00
Low-magnification 2.5× industrial objective with 8.8mm working distance for wide-field reflected light microscopy and specimen survey.
KEY FEATURES
- 2.5× Magnification, 0.45 NA — Wide field of view ideal for specimen survey, feature location, and low-magnification inspection.
- 8.8mm Working Distance — Generous clearance accommodates varied sample geometries and manipulation during observation.
- CF Plan Epi Design — Flat-field correction with optimized contrast for reflected light microscopy of opaque materials.
- ∞ Infinity-Corrected Optics — CF (Crystal Focus) design ensures compatibility with Nikon infinity-corrected microscope systems.
- Excellent Condition — Pre-owned objective in excellent working order with full optical performance.
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Technical Specifications
| Catalog Number | MUL00030 |
| Magnification | 2.5× |
| Numerical Aperture (NA) | 0.45 |
| Working Distance | 8.8mm |
| Optical Design | CF Plan Epi (Crystal Focus Plan, Epi) |
| Illumination Mode | Epi (reflected light) |
| Correction | Infinity-corrected |
| Field Correction | Plan (flat-field) |
| Thread Type | RMS (Royal Microscopical Society) |
| Compatibility | Nikon infinity-corrected microscopes |
| Application | Wide-field reflected light microscopy, specimen survey |
| Condition | Excellent |
Microscope Compatibility
Typical Applications
Initial specimen survey and feature location
Quality control and defect screening
Failure analysis and damage assessment
Metallographic overview and microstructure survey
Large-area inspection and documentation
Interactive measurement and manipulation tasks
Educational demonstrations and training
Low-magnification photomicrography
